S
Sergei V. Kalinin
Researcher at Oak Ridge National Laboratory
Publications - 1069
Citations - 43341
Sergei V. Kalinin is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Ferroelectricity & Piezoresponse force microscopy. The author has an hindex of 95, co-authored 999 publications receiving 37022 citations. Previous affiliations of Sergei V. Kalinin include Southern Illinois University Carbondale & Louisiana State University.
Papers
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Exploring Local Electrostatic Effects with Scanning Probe Microscopy: Implications for Piezoresponse Force Microscopy and Triboelectricity
TL;DR: Observations of significant surface charge states at zero bias and strong hysteretic electromechanical responses at a nonferroelectric surface have significant implications for fields such as triboelectricity and piezoresponse force microscopy.
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Domain polarity and temperature induced potential inversion on the BaTiO3(100) surface
TL;DR: In this article, a thermodynamic model for screening of ferroelectric surfaces based on Ginzburg-Devonshire theory is developed so that the enthalpy and entropy of charge compensation can be derived from the temperature dependence of surface potential contrast.
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Intermittency, quasiperiodicity and chaos in probe-induced ferroelectric domain switching
Anton V. Ievlev,Stephen Jesse,Anna N. Morozovska,Evgheni Strelcov,Eugene A. Eliseev,Yuriy V. Pershin,Amit Kumar,V. Ya. Shur,Sergei V. Kalinin +8 more
TL;DR: Ferroelectric domain switching on the surface of a lithium niobate thin film can be induced by the tip of a scanning probe microscope, and gives rise to both regular and chaotic spatiotemporal patterns as mentioned in this paper.
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Resonance enhancement in piezoresponse force microscopy: Mapping electromechanical activity, contact stiffness, and Q factor
TL;DR: In this paper, a resonance-enhanced PFM was developed that allows mapping of the local electromechanical activity, contact stiffness, and loss factor, thus avoiding limitations inherent to conventional frequency tracking.
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Towards data-driven next-generation transmission electron microscopy.
Steven R. Spurgeon,Colin Ophus,Lewys Jones,Amanda K. Petford-Long,Sergei V. Kalinin,Matthew J. Olszta,Rafal E. Dunin-Borkowski,Norman Salmon,Khalid Hattar,Wei-Chang Yang,Renu Sharma,Yingge Du,Ann N. Chiaramonti,Haimei Zheng,Edgar C. Buck,Libor Kovarik,R. Lee Penn,Dongsheng Li,Xin Zhang,Mitsuhiro Murayama,Mitra L. Taheri +20 more
TL;DR: The open, highly integrated and data-driven microscopy architecture needed to realize transformative discoveries in the coming decade is discussed.