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Jin-Seok Chung

Researcher at Soongsil University

Publications -  58
Citations -  2078

Jin-Seok Chung is an academic researcher from Soongsil University. The author has contributed to research in topics: Thin film & Ferroelectricity. The author has an hindex of 21, co-authored 57 publications receiving 1884 citations. Previous affiliations of Jin-Seok Chung include Oak Ridge National Laboratory.

Papers
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Journal Article

Giant Flexoelectric Effect in Ferroelectric Epitaxial Thin Films

Tae Won Noh, +6 more
- 01 Mar 2012 - 
TL;DR: In this paper, a combination of transmission electron microscopy, electrical measurements, and electrostatic calculations showed that flexoelectricity provides a means of tuning the physical properties of ferroelectric epitaxial thin films.
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Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams

Jin-Seok Chung, +1 more
- 19 Oct 1999 - 
TL;DR: In this paper, the authors derived methods for measuring local strain, stress, and crystallographic texture (orientation) in polycrystalline samples when 1-10 grains are simultaneously illuminated by an energy scanable or broad-bandpass x-ray beam.
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Flexoelectric effect in the reversal of self-polarization and associated changes in the electronic functional properties of BiFeO(3) thin films.

Byung-Chul Jeon, +9 more
- 01 Oct 2013 - 
TL;DR: Flexoelectricity can play an important role in the reversal of the self-polarization direction in epitaxial BiFeO3 thin films.
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Elliptical x-ray microprobe mirrors by differential deposition

Gene E. Ice, +4 more
- 28 Jun 2000 - 
TL;DR: In this article, a differential coating method is described for fabricating high performance x-ray microfocusing mirrors, which can be modified to produce elliptical surfaces with low roughness and low figure errors.
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X-ray microdiffraction study of growth modes and crystallographic tilts in oxide films on metal substrates

John D. Budai, +8 more
- 01 Jul 2003 - 
TL;DR: Focused, polychromatic synchrotron X-ray microbeams are used to penetrate multilayer materials and simultaneously characterize the local structure, orientation and strain tensor of different heteroepitaxial layers with submicrometre resolution.