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Yee-Chia Yeo

Researcher at National University of Singapore

Publications -  592
Citations -  12467

Yee-Chia Yeo is an academic researcher from National University of Singapore. The author has contributed to research in topics: Field-effect transistor & Transistor. The author has an hindex of 53, co-authored 592 publications receiving 11858 citations. Previous affiliations of Yee-Chia Yeo include Agency for Science, Technology and Research & TSMC.

Papers
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Proceedings ArticleDOI

5nm-gate nanowire FinFET

TL;DR: In this paper, a new nanowire FinFET structure was developed for CMOS device scaling into the sub-10 nm regime, and gate delay of 0.22 and 0.48 ps with excellent sub-threshold characteristics were achieved with very low off leakage cur-rent less than 10 nA/ /spl mu/m.
Journal ArticleDOI

Electronic band structures and effective-mass parameters of wurtzite GaN and InN

TL;DR: In this article, the electronic band structures of wurtzite GaN and InN are calculated by the empirical pseudopotential method (EPM) with the form factors adjusted to reproduce band features which agree with recent experimental data and accurate first-principles calculations.
Patent

Structure and method of a strained channel transistor and a second semiconductor component in an integrated circuit

TL;DR: In this article, the first and second active regions of a semiconductor chip are disposed by a resistor and a doped region between two terminals, and a strained channel transistor is formed in the second active region.
Proceedings ArticleDOI

25 nm CMOS Omega FETs

TL;DR: In this paper, low leakage and low active power 25 nm gate length C-MOSFETs are demonstrated for the first time with a newly proposed Omega-(/spl Omega/) shaped structure, at a conservative 17-19 /spl Aring/ gate oxide thickness, and with excellent hot carrier immunity.
Journal ArticleDOI

Tunneling Field-Effect Transistor: Capacitance Components and Modeling

TL;DR: In this paper, a numerical simulation study of gate capacitance components in a tunneling field effect transistor (TFET) was performed, showing key differences in the partitioning of gate capacitor between the source and drain as compared with a MOSFET.