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Proceedings ArticleDOI

An advanced CMOS imager employing modified AR and ACS methods

TLDR
In this paper, the authors presented measurements from two generations of fully operational 128times128 CMOS image sensor arrays, where they modified two existing design techniques, the active reset (AR) technique and the active column sensor (ACS) readout technique, and combined them together to achieve low-noise reset and improved spatial gain fixed pattern noise (FPN).
Abstract
In this work we present measurements from two generations of fully operational 128times128 CMOS image sensor arrays. In these imagers, we have modified two existing design techniques, the active reset (AR) technique and the active column sensor (ACS) readout technique, and combined them together to achieve low-noise reset and improved spatial gain fixed pattern noise (FPN). In addition, we have implemented three different types of pixels, employing nwell/psub photodiodes to examine the influence of the shallow trench isolation (STI) on dark currents of the photodiodes. While the first fabricated imager served as a basis for different pixels and techniques examination, the second sensor was designed based on the conclusions drawn from the measurements of the first imager. Measurements from both sensors are presented, showing that the proposed architecture achieves column-level FPN of 0.05%, pixel level FPN of 0.16% and SNR of 15 dB at illumination level as low as 4 nW/mm2, making it suitable for applications, where low light detection is required. Other imager attributes are also presented.

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Citations
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A Column-Based Pixel-Gain-Adaptive CMOS Image Sensor for Low-Light-Level Imaging(VSLI一般(ISSCC'03関連特集))

TL;DR: A 0.25 /spl mu/m technology CMOS image sensor employs a 4.2 /splMu/m pitch pinned-photodiode pixel to reduce the fixed pattern noise and the dynamic range is 69 dB.

Sensory Systems Technical Committee Annual Report

TL;DR: Delbruck et al. as mentioned in this paper have proposed a new chair for the NER task with the objective of improving the quality of the results of NER experiments and to improve the efficiency of the evaluation process.
Patent

Image sensor and operating method

TL;DR: In this article, an image sensor is made selectively to apply one of at least two test input signals to the column lines, and the image sensor has a signal preprocessing device to process a exposure signal generated by the pixels which can be applied to the respective column line.
Journal ArticleDOI

New Memory Architecture for Rolling Shutter Wide Dynamic Range CMOS Imagers

TL;DR: A new memory architecture is proposed which, in principal, is similar to time division multiplexing, such that it achieves memory size reduction by sharing a single memory location among a number of pixels as a function of time.
Patent

Bildsensor und Betriebsverfahren Image sensor and method of operation

TL;DR: In this paper, the authors describe a CMOS image sensor for electronic cameras, having a plurality of spaced rows and columns of light-sensitive pixels, wherein all or at least some of the pixels of a column are connected to a respective common column line, and wherein the image sensor is configured to selectively intrude one of at least two test input signals to the column lines.
References
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Journal ArticleDOI

A 10000 frames/s CMOS digital pixel sensor

TL;DR: In this paper, a 352/spl times/288 pixel CMOS image sensor chip with per-pixel single-slope ADC and dynamic memory in a standard digital 0.18-/spl mu/m CMOS process is described.
Journal ArticleDOI

Wide intrascene dynamic range CMOS APS using dual sampling

TL;DR: In this article, a CMOS active pixel sensor (APS) that achieves wide intrascene dynamic range using dual sampling is reported, which achieves an intrascenesensitivity of 109 dB without nonlinear companding.
Journal ArticleDOI

The analysis of dark signals in the CMOS APS imagers from the characterization of test structures

TL;DR: In this paper, the authors investigated the characteristics of dark signals in the CMOS active pixel sensor (APS) with test structures fabricated using the deep-submicron CMOS technology and found that the periphery of the photodiode (PD) is the dominant source of dark currents in our test structure, and this factor is sensitive to the distance between the sidewall of the shallow trench isolation and the n-type region of the PD.
Proceedings ArticleDOI

Reset noise suppression in two-dimensional CMOS photodiode pixels through column-based feedback-reset

TL;DR: In this paper, the authors present a new CMOS photodiode imager pixel with ultralow read noise through on-chip suppression of reset noise via column-based feedback circuitry.
Journal ArticleDOI

A Low-Light CMOS Contact Imager With an Emission Filter for Biosensing Applications

TL;DR: A fully functional low light 128 X 128 contact image sensor for cell detection in biosensing applications is presented and experimental results using live neurons from the pond snail, Lymnaea stagnalis, and fluorescence polystyrene micro-beads prove the functionality and indicate its biocompatiblity.