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Journal ArticleDOI

Depolarization fields in thin ferroelectric films

R. R. Mehta, +2 more
- 01 Aug 1973 - 
- Vol. 44, Iss: 8, pp 3379-3385
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TLDR
In this article, a mechanism was proposed to explain depolarization phenomena in thin ferroelectric films and related multilayer devices, where the center of gravity of this charge and the free compensation charge are not coincident.
Abstract
A mechanism is proposed to explain depolarization phenomena that have been observed in thin ferroelectric films and related multilayer devices. It is shown that, for a short‐circuited electrode‐ferroelectric structure, incomplete compensation of the ferroelectric polarization charge results when the center of gravity of this charge and the free compensation charge are not coincident. Depolarization fields in the ferroelectric arising from such incomplete compensations are estimated. A simple switching calculation shows such fields to be of sufficient strength to account for the initial polarization decay rate observed in Pb0.92Bi0.07La0.01 (Fe0.405Nb0.325Zr0.27)O3 films. The results of measurements involving changes in film thickness, electron concentration in the electrodes, and contact materials will be discussed and shown to be consistent with the mechanism proposed.

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Citations
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Ferroelectric thin films: Review of materials, properties, and applications

TL;DR: An overview of the state of the art in ferroelectric thin films is presented in this paper, where the authors review applications: micro-systems' applications, applications in high frequency electronics, and memories based on Ferroelectric materials.
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Critical thickness for ferroelectricity in perovskite ultrathin films

TL;DR: It is shown that, contrary to current thought, BaTiO3 thin films between two metallic SrRuO3 electrodes in short circuit lose their ferro electric properties below a critical thickness of about six unit cells, suggesting the existence of a lower limit for the thickness of useful ferroelectric layers in electronic devices.
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Mutual Insight on Ferroelectrics and Hybrid Halide Perovskites: A Platform for Future Multifunctional Energy Conversion.

TL;DR: An insight into the analogies, state-of-the-art technologies, concepts, and prospects under the umbrella of perovskite materials (both inorganic-organic hybrid halideperovskites and ferroelectric perovkites) for future multifunctional energy conversion and storage devices is provided.
Journal ArticleDOI

Interface Physics in Complex Oxide Heterostructures

TL;DR: In this paper, the authors highlight some of the exciting properties of complex transition metal oxides, including high dielectric permittivities, piezo-, pyro-, and ferroelectricity.
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Bulk Photovoltaic Effect at Visible Wavelength in Epitaxial Ferroelectric BiFeO3 Thin Films

TL;DR: The photovoltaic effect in epitaxial BFO thin films is studied and an open-circuit voltage Voc of 0.3 V is obtained, demonstrating that photocurrent direction can be switched by the polarization direction of the BFO film and that the ferroelectric polarization is the main driving force of the observed photov Holtaic effect.
References
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Journal ArticleDOI

Space-Charge Effects on Electron Tunneling

TL;DR: In this article, the one-electron (Bethe-Sommerfeld) model of electron tunneling is formulated to describe tunneling when the curvature (electron mass and centroid of the oneelectron constant energy surfaces vary across the junction.
Journal ArticleDOI

Characteristics of the Surface‐State Charge (Qss) of Thermally Oxidized Silicon

TL;DR: In this paper, the surface state charge associated with thermally oxidized silicon has been studied experimentally using MOS structures and the results indicate that the surface-state charge can be reproducibly controlled over a range 1010-1012 cm -2, and it is an intrinsic property of the silicon dioxide-silicon system.
Journal ArticleDOI

Surface Properties of II-VI Compounds

TL;DR: In this paper, the Schottky barrier heights were determined by the difference between the semiconductor electron affinity and the metal work function, provided the work function used was that for the specific metal substrate system in question.
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