Proceedings ArticleDOI
Effect of aging on power integrity of digital integrated circuits
Alexandre Boyer,S. Ben Dhia +1 more
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TLDR
Simulation based on ICEM modeling modified by an empirical coefficient in order to take into account the circuit aging is proposed to model the evolution of the power integrity induced by device aging.Abstract:
Recent studies have shown that integrated circuit aging modifies electromagnetic emission significantly. The proposed paper aims at evaluating the impact of aging on the power integrity of digital integrated circuits and clarifying its origin. On-chip measurements of power supply voltage bounces in a CMOS 90 nm technology test chip are combined with electric stress to characterize the influence of aging on power integrity. Simulation based on ICEM modeling modified by an empirical coefficient in order to take into account the circuit aging is proposed to model the evolution of the power integrity induced by device aging.read more
Citations
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Journal ArticleDOI
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project
Sonia Ben Dhia,Alexandre Boyer +1 more
TL;DR: The results of this EMRIC project give a unique overview about EMR in the scientific community and will contribute to develop EMR qualification procedures, EMR design techniques and EMR predictive methods.
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Effects of aging and compensation mechanisms in ordering based RO-PUFs
TL;DR: An accelerated aging test applied to analyze the effects of aging on ordering based RO-PUFs is presented and a compensation method to protect the 100% robustness of the PUF structure is proposed.
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Using I ddt current degradation to monitor ageing in CMOS circuits
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Proceedings ArticleDOI
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing
Sonia Ben Dhia,Alexandre Boyer +1 more
TL;DR: An on-chip noise sensor dedicated to the study of various aspects of electromagnetic compatibility at circuit level, such as power and signal integrity, substrate coupling, conducted emission and susceptibility to electromagnetic interferences is presented.
Long-term Electromagnetic Robustness of Integrated Circuits, Challenge and Trends
Alexandre Boyer,Sonia Ben Dhia +1 more
TL;DR: The paper clarifies the effect of device degradation mechanisms on EMC level drifts during lifetime and presents some attempts to predict these evolutions and a special focus on DSM components.
References
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Proceedings ArticleDOI
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Journal ArticleDOI
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