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Method and apparatus for reducing color conflicts during trim generation for phase shifters

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TLDR
In this article, a system for generating trim to be used in conjunction with phase shifters during an optical lithography process for manufacturing an integrated circuit is described, where the system operates by identifying a feature within the integrated circuit to be created by using a phase shifter to produce a region of destructive light interference.
Abstract
One embodiment of the invention provides a system for generating trim to be used in conjunction with phase shifters during an optical lithography process for manufacturing an integrated circuit The system operates by identifying a feature within the integrated circuit to be created by using a phase shifter to produce a region of destructive light interference on a photoresist layer Next, the system generates the phase shifter for a first mask, while ensuring that design rules are satisfied in defining dimensions for the phase shifter After the phase shifter is generated, the system generates trim within a second mask, that is used in conjunction with the first mask, by deriving the trim from the previously-defined dimensions of the phase shifter while ensuring that the design rules are satisfied Note that the design rules can be satisfied by cutting and/or patching portions of the phase shifter and associated trim

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Citations
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References
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Journal ArticleDOI

Improving resolution in photolithography with a phase-shifting mask

TL;DR: The phase-shifting mask as mentioned in this paper consists of a normal transmission mask that has been coated with a transparent layer patterned to ensure that the optical phases of nearest apertures are opposite.
Patent

Phase shifting circuit manufacture method and apparatus

TL;DR: In this article, the phase shift mask and the single phase structure mask are derived from a set of masks used in a larger minimum dimension process technology and used for shrinking integrated circuit designs.
Proceedings ArticleDOI

Optimum mask and source patterns to print a given shape

TL;DR: In this paper, the authors developed an algorithm that can optimize mask and source without using a starting design, where the optimized mask will often consist of novel sets of shapes that are quite different in layout from the target IC patterns.
Journal ArticleDOI

Phase-shifting masks for microlithography: automated design and mask requirements

TL;DR: A computationally viable algorithm is proposed for the rapid design of phase-shifting masks for arbitrary two-dimensional patterns based on the use of a class of optimal coherent approximations to partially coherent imaging systems described by the Hopkins model.
Patent

Phase shift masking for complex patterns with proximity adjustments

TL;DR: In this paper, techniques for extending the use of phase shift techniques to implementation of masks used for complex layouts in the layers of integrated circuits, beyond selected critical dimension features, are presented.