Journal ArticleDOI
Point source for ions and electrons
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TLDR
In this article, the authors used tips as sources for free electrons in an STM-like setup to obtain high-resolution images of surfaces with an electron beam of only 15 eV primary energy.Abstract:
Field-ion techniques have been used to create physical point sources for ions and electrons with emission areas and angles orders of magnitude smaller than in any other available source. The monatomic pyramidal tips emit electrons or ionize noble-gas atoms originating from the single front atom. The angular divergence from the normal direction above the single W atom is less than 0.5° for ion beams produced by field ionization. The angular spread for emission from small clusters is somewhat larger for field ionization and electron emission. By employing tips as sources for free electrons in an STM-like setup, we were able to obtain high-resolution images of surfaces with an electron beam of only 15 eV primary energy. The image information is contained in the yield of the secondary electrons created at the sample surface.read more
Citations
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Journal ArticleDOI
Digital in-line holographic microscopy.
Jorge Garcia-Sucerquia,W. Xu,Stephan K. Jericho,P. Klages,Manfred H. Jericho,H. Jürgen Kreuzer +5 more
TL;DR: The state of the art of digital in-line holographic microscopy with numerical reconstruction is reviewed and some technical issues, such as lateral and depth resolution, depth of field, twin image, four-dimensional tracking, and reconstruction algorithm are discussed.
Journal ArticleDOI
Field emission tip as a nanometer source of free electron femtosecond pulses.
TL;DR: This pulsed electron emitter, triggered by a femtosecond oscillator, could serve as an efficient source for time-resolved electron interferometry, for time -resolved nanometric imaging and for synchrotrons.
Patent
Ion sources, systems and methods
TL;DR: In this paper, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip).
Journal ArticleDOI
Scanning tunnelling microscopy
TL;DR: The scanning tunnelling microscopy (STM) is a very versatile instrument that can operate in ultra high vacuum, in air, in reactive gases, in corrosive solutions or at cryogenic temperatures as discussed by the authors.
Journal ArticleDOI
Theory of the point source electron microscope
TL;DR: In this article, the theory of the point source electron microscope including multiple scattering events is formulated and a Fourier-like transform is shown to be appropriate for the reconstruction of the object with atomic resolution.
References
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Journal ArticleDOI
Scanning tunneling microscopy
Paul K. Hansma,Jerry Tersoff +1 more
TL;DR: A scanning tunneling microscope (STM) can provide atomic-resolution images of samples in ultra high vacuum, moderate vacuum, gases including air at atmospheric pressure, and liquids including oil, water, liquid nitrogen, and even conductive solutions as mentioned in this paper.
Journal ArticleDOI
The Topografiner: An Instrument for Measuring Surface Microtopography
TL;DR: In this paper, a non-contacting instrument for measuring the microtopography of metallic surfaces has been developed to the point where the feasibility of constructing a prototype instrument has been demonstrated.
Journal ArticleDOI
Mono-atomic tips for scanning tunneling microscopy
TL;DR: By field-ion microscopy techniques, stable tips whose very ends are made up of just one individual atom are created, deposited from the gas phase onto an upper terrace of a pyramidal (111)-oriented tungsten tip.
Journal ArticleDOI
The Tunneling Microscope: A New Look at the Atomic World
TL;DR: A new instrument called the tunneling microscope has recently been developed that is capable of generating real-space images of surfaces showing atomic structure that offer a new view of matter on an atomic scale.
Journal ArticleDOI
Role of tip structure in scanning tunneling microscopy
Young Kuk,P. J. Silverman +1 more
TL;DR: In this article, an ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) was built for high STM resolution in a scan of the Au(001) surface, and the measured corrugation depth of the (1×5) rows was found to be a function of the size of the atomic cluster on the first plane of the tungsten tip.