PatentDOI
Scanning capacitance microscope
TLDR
In this article, a scanning capacitance probe is used to identify the topography and material properties of the surface layer of a human body in microscopic imaging using a single image of the body.Abstract:
Variations in topography and material properties of the surface layer of a body are observed in microscopic imaging using a scanning capacitance probe. The acronym SCaM identifying the process and apparatus is derived from the phrase scanning capacitance microscope. The material properties observable by SCaM are the surface-electric property representative of the complex dielectric constant of the surface material and the surface-mechanical property representative of the elastic constant of the surface material.read more
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Journal ArticleDOI
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
Journal ArticleDOI
The scanning ion-conductance microscope.
TL;DR: A scanning ion-conductance microscope (SICM) has been developed that can image the topography of nonconducting surfaces that are covered with electrolytes and sample and image the local ion currents above the surfaces.
Journal ArticleDOI
High‐resolution capacitance measurement and potentiometry by force microscopy
TL;DR: In this paper, the authors demonstrate the usefulness and high sensitivity of the atomic force microscope (AFM) for imaging surface dielectric properties and for potentiometry through the detection of electrostatic forces.
Journal ArticleDOI
Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy
TL;DR: In this paper, the authors highlight the potential of Kelvin probe force microscopy (KPFM) beyond imaging to simultaneously study structural and electronic properties of functional surfaces and interfaces, which is of paramount importance since it is well established that a solid surface possesses different properties than the bulk material.
Journal ArticleDOI
Collection mode near‐field scanning optical microscopy
TL;DR: In this paper, a collection mode near-field scanning optical microscopy was used to obtain super-resolution images of aluminum lines separated by 0.25 μm with peak edge sharpness of 0.07 μm.
References
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Patent
Scanning tunneling microscope
Gerd Binnig,Heinrich Rohrer +1 more
TL;DR: In this paper, a fine tip is raster scanned across the surface of a conducting sample at a distance of a few Angstroms, and the vertical separation between the tip and sample surface is automatically controlled so as to maintain constant a measured variable which is proportional to the tunnel resistance, such as tunneling current.
Patent
Information records and recording/playback systems therefor
TL;DR: In this article, the capacitance between an electrode in a pickup tracking in a groove and the metallized surface of the storage medium varies in accordance with the modulated information track as the pickup device scans the recording medium.
Journal ArticleDOI
Hole mobility and transport in thin SiO2 films
TL;DR: In this article, the first measurement of hole mobility and its temperature dependence in thermally grown SiO2 on Si was reported and found to follow μ≃20 exp(−0.6eV/kT) cm2/V sec.
Patent
Acoustic microscope and method
TL;DR: In this paper, a plurality of devices are used for exciting an object of interest so that acoustic waves are propagated from the object to the object in a raster scanning pattern, and the magnitude of the detected acoustic waves and the corresponding raster pattern of the object are recorded so that a visual image can be obtained.