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Wave Optics Theory of Rotary Compensators

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TLDR
In this article, Berek and Ehringhaus rotary compensators are analyzed within the framework of classical electromagnetic theory, and exact solutions for the phase difference and amplitude ratio of the transmitted light can be determined.
Abstract
The theory conventionally used to describe the operation of Berek and Ehringhaus rotary compensators is based on geometrical optics and, hence, is not exact. When rotary compensators are analyzed within the framework of classical electromagnetic theory, exact solutions for the phase difference and amplitude ratio of the transmitted light can be determined. The approximate and exact solutions differ in some interesting ways which become of substantial importance in the examination of monochromatic plane waves of light. In particular, the discrepancies between exact and approximate solutions become more pronounced at high angles of incidence. Exact theory predicts the possibility of using a high-refractive index isotropic plate for measuring small phase differences at relatively long wavelengths.

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Citations
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Journal ArticleDOI

Formulas for Using Wave Plates in Ellipsometry

TL;DR: Formulas are presented for the use of optical compensators in ellipsometers that can be used, without modification, when the compensator is not an exact quarter-wave plate, when multiple internal reflections are present, and when the compensate is absorbing.
Journal ArticleDOI

Complete polarization state generator with one variable retarder and its application for fast and sensitive measuring of two-dimensional birefringence distribution.

TL;DR: The complete polarization state generator (PSG) as mentioned in this paper consists of one rotatable polarizer and one variable retarder with a quarter-wave plate, which is employed in the quantitative orientationindependent differential polarization microscope, which uses polarized light states with the same ellipticity and different orientation angles.
Journal ArticleDOI

Electromagnetic Wave Propagation in Birefringent Multilayers

TL;DR: Reflection and transmission of birefringent plates surrounded by semi-infinite bireringent media with incident waves having polarized electric fields was studied in this article, where incident waves had polarized electric field.
Journal ArticleDOI

Transmission ellipsometry on transparent unbacked or embedded thin films with application to soap films in air

TL;DR: The ratio rho(t) = T(p)/T(s) of the complex amplitude transmission coefficients for the p and s polarizations of a transparent unbacked or embedded thin film is examined as a function of the film thickness-to-wavelength ratio d/lambda and the angle of incidence Phi for a given film refractive index N.
Journal ArticleDOI

Form birefringence of SiO 2 /Ta 2 O 5 periodic multilayers

TL;DR: In this article, the birefringent properties of dielectric multilayers consisting of alternating layers of SiO2 and Ta2O5 with a period as short as 42 nm are analyzed.
References
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Journal ArticleDOI

Determination of the Properties of Films on Silicon by the Method of Ellipsometry

TL;DR: The use of exact reflection theory to interpret data allows the application of ellipsometry to the determination of the thicknesses and optical constants of surface films without the thickness limitations of approximate theory.
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Optical Compensators for Measurement of Elliptical Polarization

TL;DR: A detailed survey of the present-day knowledge of optical compensators is given in this article, with a reference made to the sensitivity and accuracy of the compensators and their applications.
Journal ArticleDOI

Exact theory of retardation plates.

TL;DR: In this article, the authors show that the conventional solutions to the problem of normally incident light transmission through homogeneous, birefringent, nonoptically active, nonabsorbing, crystalline plate are not exact.
Journal ArticleDOI

Zur Optik dünner doppelbrechender und dichroitischer Schichten

TL;DR: Fur eine anisotrope (doppelbrechende and dichroitische) Schicht werden unter Berucksichtigung der Mehrfachreflexionen in ihrem Inneren die Gleichungen fur die komplexen Amplituden, die Intensitaten, die absoluten Phasen, Reflexion and Durchgang bei schragem Lichteinfall berechnet.
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