Journal ArticleDOI
Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
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TLDR
It is shown that in the limit of a large objective (probe-forming) aperture, relevant to a spherical aberration corrected microscope, the Z-contrast image of a zone-axis crystal becomes an image of the 1s Bloch states.Abstract:
We show that in the limit of a large objective (probe-forming) aperture, relevant to a spherical aberration corrected microscope, the Z-contrast image of a zone-axis crystal becomes an image of the 1s Bloch states. The limiting resolution is therefore the width of the Bloch states, which may be greater than that of the free probe. Nevertheless, enormous gains in image quality are expected from the improved contrast and signal-to-noise ratio. We present an analytical channeling model for the thickness dependence of the Z-contrast image in a zone-axis crystal, and show that, at large thicknesses, columnar intensities become proportional to the mean square atomic number, Z(2).read more
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Journal ArticleDOI
Enhanced strength and ductility in a high-entropy alloy via ordered oxygen complexes
Zhifeng Lei,Xiongjun Liu,Yuan Wu,Hui Wang,Suihe Jiang,S. D. Wang,Xidong Hui,Yidong Wu,Baptiste Gault,Paraskevas Kontis,Dierk Raabe,Lin Gu,Qinghua Zhang,Houwen Chen,Hongtao Wang,Jiabin Liu,Ke An,Qiaoshi Zeng,T.G. Nieh,Zhaoping Lu +19 more
TL;DR: It is shown that oxygen can take the form of ordered oxygen complexes, a state in between oxide particles and frequently occurring random interstitials, which lead to unprecedented enhancement in both strength and ductility in compositionally complex solid solutions, the so-called high-entropy alloys (HEAs).
Journal ArticleDOI
A practical approach for STEM image simulation based on the FFT multislice method.
TL;DR: A new practical scheme for a STEM image simulation is developed based on the FFT multislice algorithm that will have a definitive advantage over the Bloch wave approach for simulating the HAADF images expected from a defect and interface or amorphous materials, and also theHAADF image obtained by using a Cs-corrected microscope.
Journal ArticleDOI
Progress in aberration-corrected scanning transmission electron microscopy.
TL;DR: A new corrector of spherical aberration (C(S) for a dedicated scanning transmission electron microscope (STEM) is described and its results are presented and the present limits of aberration-corrected STEM are discussed.
Journal ArticleDOI
Electron microscopy of solid catalysts--transforming from a challenge to a toolbox
TL;DR: This poster presents a probabilistic procedure for estimating the response of the immune system to x-ray diffraction and describes three different types of responses: “normal”, “spatially predictable” and “drug-like”.
Reference EntryDOI
Particle Size and Dispersion Measurements
Gérard Bergeret,Pierre Gallezot +1 more
TL;DR: The relationship between Particle size, surface area, and dispersal is discussed in this article, where the authors propose a method to measure the nuclearity of a particle by gas chemisorption.
References
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Electron Microscopy of Thin Crystals
TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
Journal ArticleDOI
The electronic structure at the atomic scale of ultrathin gate oxides
TL;DR: In this paper, the authors used electron-energy-loss spectroscopy in a scanning transmission electron microscope to measure the chemical composition and electronic structure, at the atomic scale, across gate oxides as thin as one nanometre.
Journal ArticleDOI
Electron microscopy image enhanced
TL;DR: In this paper, the authors report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality, which can be used to improve the resolution of the electron microscope.
Journal ArticleDOI
The Theoretical Resolution Limit of the Electron Microscope
TL;DR: The resolving power of the electron microscope and the contrast in the image are calculated for different conditions of focusing, illumination and aperture as mentioned in this paper, which can change the limit of resolution by a factor of about 3.
Journal ArticleDOI
High-resolution Z-contrast imaging of crystals
TL;DR: In this article, the use of a high-angle annular detector in a scanning transmission electron microscope is shown to provide incoherent images of crystalline materials with strong compositional sensitivity.