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Christian Lavoie
Researcher at IBM
Publications - 329
Citations - 8177
Christian Lavoie is an academic researcher from IBM. The author has contributed to research in topics: Silicide & Thin film. The author has an hindex of 41, co-authored 322 publications receiving 7772 citations. Previous affiliations of Christian Lavoie include GlobalFoundries & Toshiba.
Papers
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Journal ArticleDOI
Ambipolar electrical transport in semiconducting single-wall carbon nanotubes.
Richard Martel,Vincent Derycke,Christian Lavoie,Joerg Appenzeller,K.K. Chan,Jerry Tersoff,Ph. Avouris +6 more
TL;DR: Single-wall carbon nanotube (SWNT) field-effect transistors offer the novel possibility of ambipolar Ohmic contacts and the properties of SWNT junctions to TiC are discussed in detail.
Journal ArticleDOI
Towards implementation of a nickel silicide process for CMOS technologies
TL;DR: In this paper, the advantages and disadvantages of nickel silicide as a material for the electrical contacts to the source, drain and gate of current and future CMOS devices are discussed.
Journal ArticleDOI
Thin film reaction of transition metals with germanium
TL;DR: In this paper, the thermally induced reaction of 20 transition metals (Ti, Zr, Hf, V, Nb, Ta, Cr, Mo, W, Mn, Re, Fe, Ru, Co, Rh, Ir, Ni, Pd, Pt, and Cu) with Ge substrates was carried out in order to identify appropriate contact materials in Ge-based microelectronic circuits.
Patent
Self-aligned process for nanotube/nanowire FETs
Phaedon Avouris,Roy A. Carruthers,Jia Chen,Christopher Detavernier,Christian Lavoie,Hon-Sum Philip Wong +5 more
TL;DR: In this article, a complementary metal oxide semiconductor (CMOS) device, e.g., a field effect transistor (FET), that includes at least one one-dimensional nanostructure that is typically a carbon-based nanomaterial, as the device channel, and a metal carbide contact that is self-aligned with the gate region of the device is described.
Proceedings ArticleDOI
Metal-gate FinFET and fully-depleted SOI devices using total gate silicidation
J. Kedzierski,Edward J. Nowak,T. Kanarsky,Y. Zhang,Diane C. Boyd,Roy A. Carruthers,C. Cabral,R. Amos,Christian Lavoie,Ronnen Andrew Roy,J. Newbury,E. Sullivan,J. Benedict,P. Saunders,Keith Kwong Hon Wong,Donald F. Canaperi,Mahadevaiyer Krishnan,K.-L. Lee,Beth Ann Rainey,David M. Fried,Peter E. Cottrell,Hon-Sum P. Wong,Meikei Ieong,Wilfried Haensch +23 more
TL;DR: In this paper, metal-gate FinFET and FDSOI devices were fabricated using total gate silicidation, and they satisfy the following metal gate technology requirements: ideal mobility, low gate leakage, high transconductance, competitive I/sub on/I/sub off, and adjustable V/sub t/.