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Dean E. Probst

Researcher at Fairchild Semiconductor International, Inc.

Publications -  37
Citations -  1464

Dean E. Probst is an academic researcher from Fairchild Semiconductor International, Inc.. The author has contributed to research in topics: Trench & Field-effect transistor. The author has an hindex of 15, co-authored 37 publications receiving 1459 citations.

Papers
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Patent

Trench-gate field effect transistors and methods of forming the same

TL;DR: In this paper, a gate electrode is disposed in the gate trench over but insulated from the at least one conductive shield electrode, and a gate dielectric layer is formed such that it flares out and extends directly under the body region.
Patent

Methods of making power semiconductor devices with thick bottom oxide layer

TL;DR: In this paper, a conformal oxide film is used to fill the bottom of a trench formed in a semiconductor substrate and cover a top surface of the substrate, and then the oxide film can be etched off the top surface and inside the trench to leave a substantially flat layer of oxide having a target thickness at bottom of the trench.
Patent

Self-aligned trench mosfets and methods for making the same

TL;DR: In this article, a self-aligned structure for the MOSFET is provided by making the sidewall of the overlying isolation dielectric layer substantially aligned with the gate conductor.
Patent

Method of manufacturing trench field effect transistors with trenched heavy body

TL;DR: In this paper, a process for manufacturing trench field effect transistors improves transistor ruggedness without compromising transistor cell pitch by etching a trench into the body region and filling the heavy body trench with high conductivity material such as metal that makes contact to both the body and the source region.