Journal ArticleDOI
Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams
Jin-Seok Chung,Gene E. Ice +1 more
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In this paper, the authors derived methods for measuring local strain, stress, and crystallographic texture (orientation) in polycrystalline samples when 1-10 grains are simultaneously illuminated by an energy scanable or broad-bandpass x-ray beam.Abstract:
Methods are derived for measuring local strain, stress, and crystallographic texture (orientation) in polycrystalline samples when 1–10 grains are simultaneously illuminated by an energy scanable or broad-bandpass x-ray beam. The orientation and unit-cell shape for each illuminated grain can be determined from the diffracted directions of four Bragg reflections. The unit-cell volume is determined by measuring the energy (wavelength) of one reflection. The methods derived include an algorithm for simultaneously indexing the reflections from overlapping crystal Laue patterns and for determining the average strain and stress tensor of each grain. This approach allows measurements of the local strain and stress tensors which are impractical with traditional techniques.read more
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Three-dimensional X-ray structural microscopy with submicrometre resolution
TL;DR: A three-dimensional X-ray microscopy technique that uses polychromatic synchrotron X-rays to probe local crystal structure, orientation and strain tensors with submicrometre spatial resolution is described, applicable to single-crystal, polycrystalline, composite and functionally graded materials.
Journal ArticleDOI
Three-dimensional maps of grain boundaries and the stress state of individual grains in polycrystals and powders
Henning Friis Poulsen,S.F. Nielsen,E.M. Lauridsen,Søren Schmidt,Robert M. Suter,U. Lienert,L. Margulies,T. Lorentzen,D. Juul Jensen +8 more
TL;DR: In this paper, a fast and non-destructive method for generating three-dimensional maps of the grain boundaries in undeformed polycrystals is presented, which relies on tracking of micro-focused high-energy X-rays.
Journal ArticleDOI
Scanning X-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films.
Nobumichi Tamura,Alastair A. MacDowell,Ralph Spolenak,B. C. Valek,John C. Bravman,W. L. Brown,Richard Celestre,Howard A. Padmore,B. W. Batterman,J. R. Patel +9 more
TL;DR: Scanning X-ray microdiffraction (microSXRD) combines the use of high-brilliance synchrotron sources with the latest achromaticX-ray focusing optics and fast large-area two-dimensional-detector technology to study thin aluminium and copper blanket films and lines following electromigration testing and/or thermal cycling experiments.
Journal ArticleDOI
Tracking: a method for structural characterization of grains in powders or polycrystals
TL;DR: In this paper, a method for fast and non-destructive characterization of individual grains inside bulk materials (powders or polycrystals) is presented, where positions, volumes and orientations of hundreds of grains are determined simultaneously.
Journal ArticleDOI
Residual stress evaluation at the micrometer scale: Analysis of thin coatings by FIB milling and digital image correlation
TL;DR: In this paper, an optimised method for residual stress determination at the microscopic scale is presented, which involves incremental Focused Ion Beam (FIB) milling of annular trenches at material surface, combined with high resolution SEM imaging of a previously deposited marker pattern.
References
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Book
International tables for X-ray crystallography
Norman Fordyce McKerron Henry,Lonsdale, Kathleen, Dame,John S. Kasper,Caroline H. MacGillavry,Gerard D. Rieck,James A. Ibers,Walter C. Hamilton +6 more
Book
Residual Stress: Measurement by Diffraction and Interpretation
Ismail C. Noyan,J. B. Cohen +1 more
TL;DR: In this paper, the authors proposed a method to measure residual stress from X-ray diffraction data. But, their method is not suitable for the analysis of nonlinear elasticity theory.
Journal ArticleDOI
Angle calculations for 3- and 4-circle x-ray and neutron diffractometers.
W. R. Busing,H. A. Levy +1 more
TL;DR: In this article, the authors derived methods for calculations useful in the operation of 3and 4-circle X-ray or neutron singlecrystal diffractometers, and used them to refine cell and orientation parameters by the method of least squares.
Book
Accelerator-based atomic physics : techniques and applications
TL;DR: An overview of the instrumentation and experimental techniques currently in use in the field of accelerator-based atomic physics, and a discussion of their application to problems in atomic physics can be found in this article.