L
Leonardo Sala
Researcher at Paul Scherrer Institute
Publications - 18
Citations - 826
Leonardo Sala is an academic researcher from Paul Scherrer Institute. The author has contributed to research in topics: Femtosecond & Laser. The author has an hindex of 10, co-authored 18 publications receiving 554 citations.
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Journal ArticleDOI
Strain wave pathway to semiconductor-to-metal transition revealed by time-resolved X-ray powder diffraction
Céline Mariette,Maciej Lorenc,Hervé Cailleau,Eric Collet,Laurent Guérin,A. Volte,Elzbieta Trzop,Roman Bertoni,X. Dong,B. Lépine,Olivier Hernandez,Etienne Janod,Laurent Cario,V. Ta Phuoc,Shin-ichi Ohkoshi,Hiroko Tokoro,Hiroko Tokoro,L. Patthey,Andrej Babic,Ivan Usov,Dmitry Ozerov,Leonardo Sala,Simon Ebner,P. Böhler,A. Keller,Alexander Roland Oggenfuss,T. Zmofing,S. Redford,S. Vetter,Rolf Follath,Pavle Juranić,Akos Schreiber,Paul Beaud,Vincent Esposito,Vincent Esposito,Yunpei Deng,Gerhard Ingold,Majed Chergui,Giulia F. Mancini,Giulia F. Mancini,Roman Mankowsky,C. Svetina,Serhane Zerdane,Aldo Mozzanica,Alexei Bosak,Michael Wulff,Matteo Levantino,Henrik T. Lemke,Marco Cammarata,Marco Cammarata +49 more
TL;DR: In this article, a femtosecond powder X-ray diffraction was employed to measure the lattice deformation in the phase transition as a function of time, and the early intra-cell distortion around the light absorbing metal dimer and the long range deformations governed by acoustic waves propagating from the laser-exposed Ti3O5 surface.
Journal ArticleDOI
Strain Wave Pathway to Semiconductor-to-Metal Transition revealed by time resolved X-ray powder diffraction
Céline Mariette,Maciej Lorenc,Hervé Cailleau,Eric Collet,Laurent Guérin,A. Volte,Elzbieta Trzop,Roman Bertoni,X. Dong,B. Lépine,Olivier Hernandez,Etienne Janod,Laurent Cario,V. Ta Phuoc,Shin-ichi Ohkoshi,Hiroko Tokoro,L. Patthey,Andrej Babic,Ivan Usov,Dmitry Ozerov,Leonardo Sala,Simon Ebner,P. Böhler,A. Keller,Alexander Roland Oggenfuss,T. Zmofing,S. Redford,S. Vetter,Rolf Follath,Pavle Juranić,Akos Schreiber,Paul Beaud,Vincent Esposito,Yunpei Deng,Gerhard Ingold,Majed Chergui,Giulia F. Mancini,Roman Mankowsky,C. Svetina,Serhane Zerdane,Aldo Mozzanica,Michael Wulff,Matteo Levantino,Henrik T. Lemke,Marco Cammarata +44 more
TL;DR: It is shown how strain waves, launched by electronic and structural precursor phenomena, determine a coherent macroscopic transformation pathway for the semiconducting-to-metal transition in bistable Ti3O5 nanocrystals.
Journal ArticleDOI
Resolution extension by image summing in serial femtosecond crystallography of two-dimensional membrane-protein crystals
C. Casadei,Ching-Ju Tsai,Anton Barty,Mark S. Hunter,Nadia A. Zatsepin,Celestino Padeste,Guido Capitani,W. Henry Benner,Sébastien Boutet,Stefan P. Hau-Riege,Christopher Kupitz,Marc Messerschmidt,John I. Ogren,Tom Pardini,Kenneth J. Rothschild,Leonardo Sala,Brent W. Segelke,Garth J. Williams,James E. Evans,Xiao-Dan Li,Matthew A. Coleman,Bill Pedrini,Matthias Frank +22 more
TL;DR: The resolution limit of serial diffraction from two-dimensional crystals at a free-electron laser was extended to the detector edge (4 Å) by exploiting the large redundancy of the data set.
Journal ArticleDOI
Structure-factor amplitude reconstruction from serial femtosecond crystallography of two-dimensional membrane-protein crystals
C. Casadei,Karol Nass,Anton Barty,Mark S. Hunter,Celestino Padeste,Ching-Ju Tsai,Sébastien Boutet,Marc Messerschmidt,Leonardo Sala,Garth J. Williams,Dmitry Ozerov,Matthew A. Coleman,Xiao-Dan Li,Matthias Frank,Bill Pedrini +14 more
TL;DR: Three-dimensional intensities were reconstructed from serial crystallography data using two-dimensional crystals to derive three-dimensional intensity values for Na6(CO3)(SO4)2, Na2SO4, and Na2CO3.
SwissFEL - Beam Synchronous Data Acquisition - The First Year
Simon Ebner,H. Brands,Babak Kalantari,Rene Kapeller,Fabian Märki,Leonardo Sala,Christof Zellweger +6 more
TL;DR: An overview of the design and specialities of the SwissFEL beam-synchronous data-acquisition system is given as well as talk about the findings and problems the system faced during machine commissioning.