N
Nikolay N. Mikhailov
Researcher at Russian Academy of Sciences
Publications - 285
Citations - 2413
Nikolay N. Mikhailov is an academic researcher from Russian Academy of Sciences. The author has contributed to research in topics: Quantum well & Molecular beam epitaxy. The author has an hindex of 23, co-authored 250 publications receiving 2099 citations. Previous affiliations of Nikolay N. Mikhailov include Tomsk State University & Novosibirsk State University.
Papers
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Journal ArticleDOI
Thermoelectric transport in two-dimensional topological insulator state based on HgTe quantum well
G. M. Gusev,O. E. Raichev,E. B. Olshanetsky,Andrew Levin,Z. D. Kvon,Nikolay N. Mikhailov,Sergey A. Dvoretsky +6 more
TL;DR: In this article, the authors present a theoretical model which accounts for both the edge and bulk contributions to the electrical conductivity and thermoelectric effect in a 2D topological insulator, including the effects of edge to bulk leakage.
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Microwave Photoresistance of a Two-Dimensional Topological Insulator in a HgTe Quantum Well
A. S. Yaroshevich,Z. D. Kvon,Z. D. Kvon,G. M. Gusev,Nikolay N. Mikhailov,Nikolay N. Mikhailov +5 more
TL;DR: The microwave photoresistance of a two-dimensional topological insulator in a HgTe quantum well with an inverted spectrum has been experimentally studied under irradiation at frequencies of 110-169 GHz as discussed by the authors.
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Photoluminescence of CdHgTe based nanoheterostructures
K. D. Mynbaev,N. L. Bazhenov,V. I. Ivanov-Omskiĭ,A. V. Shilyaev,V. S. Varavin,Nikolay N. Mikhailov,Sergey A. Dvoretsky,Yu. G. Sidorov +7 more
TL;DR: In this paper, the photoluminescence spectra of nano-hetero-structures grown by molecular beam epitaxy on CdTe/ZnTe/GaAs substrates were studied.
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Methodological and instrumental problems in high-precision in situ ellipsometry diagnostics of the mercury cadmium telluride layer composition in molecular beam epitaxy
V. A. Shvets,V. A. Shvets,I. A. Azarov,I. A. Azarov,E. V. Spesivtsev,S. V. Rykhlitskii,M. V. Yakushev,D. V. Marin,Nikolay N. Mikhailov,V. D. Kuzmin,V. G. Remesnik,Sergey A. Dvoretsky,Sergey A. Dvoretsky +12 more
TL;DR: In this article, a high-stability laser ellipsometer has been designed to monitor the in situ MCT layer growth by the molecular beam epitaxy, which allowed a decrease in the dispersion of the MCT composition by an order of magnitude from experiment to experiment and its precision to be maintained at a level of ± 0.003 mole fractions of CdTe.
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Blue-shift in photoluminescence of ion-milled HgCdTe films and relaxation of defects induced by the milling
M. Pociask,I. I. Izhnin,K. D. Mynbaev,A. I. Izhnin,Sergey A. Dvoretsky,Nikolay N. Mikhailov,Yu. G. Sidorov,V. S. Varavin +7 more
TL;DR: In this paper, simultaneous measurements of electrical conductivity, Hall coefficient, and photoluminescence spectra of ion-milled Hg1−−xCdxTe films were performed during post-milling ageing of the films at 293 K.