O
Ondrej L. Krivanek
Researcher at Arizona State University
Publications - 232
Citations - 11269
Ondrej L. Krivanek is an academic researcher from Arizona State University. The author has contributed to research in topics: Scanning transmission electron microscopy & Electron energy loss spectroscopy. The author has an hindex of 45, co-authored 227 publications receiving 10224 citations. Previous affiliations of Ondrej L. Krivanek include Rice University & University of California, Berkeley.
Papers
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Journal ArticleDOI
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
Ondrej L. Krivanek,Matthew F. Chisholm,Valeria Nicolosi,Timothy J. Pennycook,Timothy J. Pennycook,G.J. Corbin,Niklas Dellby,M.F. Murfitt,Christopher S. Own,Z.S. Szilagyi,Mark P. Oxley,Mark P. Oxley,Sokrates T. Pantelides,Sokrates T. Pantelides,Stephen J. Pennycook,Stephen J. Pennycook +15 more
TL;DR: Annular dark-field imaging in an aberration-corrected scanning transmission electron microscope optimized for low voltage operation can resolve and identify the chemical type of every atom in monolayer hexagonal boron nitride that contains substitutional defects.
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Sub-ångstrom resolution using aberration corrected electron optics
TL;DR: The implementation of a computer-controlled aberration correction system in a scanning transmission electron microscope, which is less sensitive to chromatic aberration, is reported here and allows dynamic imaging of single atoms, clusters of a few atoms, and single atomic layer ‘rafts' of atoms coexisting with Au islands on a carbon substrate.
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Vibrational spectroscopy in the electron microscope
Ondrej L. Krivanek,Tracy C. Lovejoy,Niklas Dellby,Toshihiro Aoki,Ray Carpenter,Peter Rez,Emmanuel Soignard,Jiangtao Zhu,Philip E. Batson,Maureen J. Lagos,Ray F. Egerton,Peter A. Crozier +11 more
TL;DR: It is demonstrated that the vibrational signal has both high- and low-spatial-resolution components, that the first component can be used to map vibrational features at nanometre-level resolution, and that the second component can been used for analysis carried out with the beam positioned just outside the sample—that is, for ‘aloof’ spectroscopy that largely avoids radiation damage.
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Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
David A. Muller,L. Fitting Kourkoutis,M.F. Murfitt,J. H. Song,J. H. Song,Harold Y. Hwang,John Silcox,Niklas Dellby,Ondrej L. Krivanek +8 more
TL;DR: Using a fifth-order aberration-corrected scanning transmission electron microscope, which provides a factor of 100 increase in signal over an uncorrected instrument, two-dimensional elemental and valence-sensitive imaging at atomic resolution is demonstrated by means of electron energy-loss spectroscopy.
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Surface roughness at the Si(100)-SiO 2 interface
TL;DR: The spectral properties of the HRTEM roughness on normally prepared and intentionally roughened samples appears to be well characterized as a first-order autoregressive or Markovian process which corresponds to an exponential decay in the autocovariance function rather than the usual Gaussian approximation which has been widely used.