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Pietro Ferraro

Researcher at National Research Council

Publications -  720
Citations -  14634

Pietro Ferraro is an academic researcher from National Research Council. The author has contributed to research in topics: Digital holography & Holography. The author has an hindex of 61, co-authored 653 publications receiving 12666 citations. Previous affiliations of Pietro Ferraro include Aeritalia & Centre national de la recherche scientifique.

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Refocusing criterion via sparsity measurements in digital holography.

TL;DR: It is shown that, by using the sparsity measure coefficient regarded as a refocusing criterion in the holographic reconstruction, it is possible to recover the focus plane and establish the degree of sparsity of digital holograms, when samples of the diffraction Fresnel propagation integral are used as a sparse signal representation.
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Tunable liquid microlens arrays in electrode-less configuration and their accurate characterization by interference microscopy

TL;DR: The improvements to the experimental set-up and procedure allow to reveal the two lens regimes which exhibit different optical properties, which could be of great interest to the field of micro-optics thanks to the possibility to achieve focus tuning without moving parts and thus favouring the miniaturization of the optical systems.
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Three-dimensional image fusion by use of multiwavelength digital holography.

TL;DR: It is demonstrated experimentally that, through the image fusion technique with multiresolution wavelet decomposition, it is possible to increase the details and contrast of 3D reconstructed images obtained by multiwavelength digital holography.
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Full Color 3-D Imaging by Digital Holography and Removal of Chromatic Aberrations

TL;DR: In this article, the compensation of the chromatic aberrations can be achieved by using all of the information contained in the multi-wavelength digital holograms, resulting in perfect full color amplitude reconstructions.
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Method for measuring the refractive index and the thickness of transparent plates with a lateral-shear, wavelength-scanning interferometer

TL;DR: A new method for measuring simultaneously the thickness and the refractive index of a transparent plate is proposed, based on a simple, variable lateral-shear, wavelength-scanning interferometer.