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Seung-Eon Ahn

Researcher at Samsung

Publications -  115
Citations -  6151

Seung-Eon Ahn is an academic researcher from Samsung. The author has contributed to research in topics: Non-volatile memory & Layer (electronics). The author has an hindex of 35, co-authored 109 publications receiving 5854 citations. Previous affiliations of Seung-Eon Ahn include Korea University & Ewha Womans University.

Papers
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Journal ArticleDOI

Electrical observations of filamentary conductions for the resistive memory switching in NiO films

TL;DR: In this paper, the bistable resistive memory switching in submicron sized NiO memory cells was investigated using a current-bias method, and anomalous resistance fluctuations between resistance states were observed during the resistive transition from high resistance state to low resistance state.
Journal ArticleDOI

Gated three-terminal device architecture to eliminate persistent photoconductivity in oxide semiconductor photosensor arrays

TL;DR: A gated amorphous oxide semiconductor photo thin-film transistor (photo-TFT) that can provide direct control over the position of the Fermi level in the active layer and is integrated in a transparent active-matrix photosensor array that has potential applications in contact-free interactive displays.
Journal ArticleDOI

Electrical manipulation of nanofilaments in transition-metal oxides for resistance-based memory.

TL;DR: Through experiments on the negative resistance switching phenomenon in Pt-NiO-Pt structures, a nanofilament channels that can be electrically connected or disconnected are fabricated that are ideal for the basis for high-speed, high-density, nonvolatile memory applications.
Proceedings ArticleDOI

Multi-layer cross-point binary oxide resistive memory (OxRRAM) for post-NAND storage application

TL;DR: In this article, a multi-layer cross-point structured binary oxide resistive memory (OxRRAM) has been tested for next generation non-volatile random access high density data storage application.