Y
Youdou Zheng
Researcher at Nanjing University
Publications - 557
Citations - 7057
Youdou Zheng is an academic researcher from Nanjing University. The author has contributed to research in topics: Chemical vapor deposition & Photoluminescence. The author has an hindex of 31, co-authored 493 publications receiving 5015 citations. Previous affiliations of Youdou Zheng include Xiamen University.
Papers
More filters
Journal ArticleDOI
The parameters in the band-anticrossing model for In x Ga 1- x N y P 1- y before and after annealing
ChuanZhen Zhao,Rong Zhang,Bin Liu,LiYuan Yu,Chun-Xiao Tang,Zili Xie,Xiangqian Xiu,Youdou Zheng +7 more
TL;DR: In this paper, the authors investigated the parameters in the band-anticrossing (BAC) model for GaNP and InGaPN and found that the band gap bowing of In-GaNP is stronger than that of InGaNAs.
Journal ArticleDOI
A 1100 + V AlGaN/GaN-Based Planar Schottky Barrier Diode without Edge Termination
TL;DR: In this article, a planar Schottky barrier diodes with various spacings between ohmic and planar contacts are fabricated without any edge termination, and the reverse leakage current of the devices quickly saturates at low reverse bias when the two-dimensional electron gas (2DEG) at the AlGaN/GaN interface is fully depleted.
Journal ArticleDOI
Homo-epitaxial growth of high crystal quality GaN thin films by plasma assisted–molecular beam epitaxy
Yaozheng Wu,Bin Liu,Li Zhenhua,Tao Tao,Zili Xie,Xiangqian Xiu,Peng Chen,Dunjun Chen,Hai Lu,Yi Shi,Rong Zhang,Youdou Zheng +11 more
TL;DR: In this paper, high quality MBE-GaN films homo-epitaxially grown on GaN/sapphire templates and free standing GaN substrates by plasma-assisted molecular beam epitaxy (PA-MBE) have been investigated.
Journal ArticleDOI
Investigations of the gate instability characteristics in Schottky/ohmic type p-GaN gate normally-off AlGaN/GaN HEMTs
Chang-Kun Zeng,Weizong Xu,Yuanyang Xia,Danfeng Pan,Yi-wang Wang,Qiang Wang,Youhua Zhu,Fang-Fang Ren,Dong Zhou,Jiandong Ye,Dunjun Chen,Rong Zhang,Youdou Zheng,Hai Lu +13 more
Journal ArticleDOI
Discrimination Voltage and Overdrive Bias Dependent Performance Evaluation of Passively Quenched SiC Single-Photon-Counting Avalanche Photodiodes
TL;DR: In this paper, a mesa-type 4H-SiC UV avalanche photodiode (APD) is designed and fabricated, which exhibits low leakage current and high avalanche gain.