Y
Youdou Zheng
Researcher at Nanjing University
Publications - 557
Citations - 7057
Youdou Zheng is an academic researcher from Nanjing University. The author has contributed to research in topics: Chemical vapor deposition & Photoluminescence. The author has an hindex of 31, co-authored 493 publications receiving 5015 citations. Previous affiliations of Youdou Zheng include Xiamen University.
Papers
More filters
Journal ArticleDOI
Raman study of strained SiGe layers
TL;DR: In this paper, the authors used Auger Electron Spectroscopy to detect the Ge composition in the SiGe layers and found that the ge composition is not uniform in strained SiGe layer.
Journal ArticleDOI
Stress-free InN nanowires grown on graphene by sublimation method
Lin Chen,Lin Chen,Li Yuewen,Xiangqian Xiu,Chen Dingding,Hua Xuemei,Zili Xie,Peng Chen,Bin Liu,Ping Han,Rong Zhang,Youdou Zheng +11 more
TL;DR: In this article, stress-free InN nanowires (NWs) have been grown on Au/graphene/GaN/sapphire substrate by atmospheric pressure metal-In sublimation method.
Journal ArticleDOI
Current transport dynamics and stability characteristics of the NiO x based gate structure for normally-off GaN HEMTs
Yonghao Du,Weizong Xu,Hehe Gong,Jiandong Ye,Feng Zhou,Fang-Fang Ren,Dong-Yi Zhou,Dunjun Chen,Rong Zhang,Youdou Zheng,Haixia Liu +10 more
TL;DR: In this paper , a device configuration exploration combining the p-NiO x gate cap layer and a thin AlGaN barrier layer is presented, where a nitrogen based post-annealing process is developed to improve the film stoichiometry for elevated gate controllability, realizing normally off operation with enhanced channel conduction capability.
Journal ArticleDOI
Investigation of switching kinetics of interface traps in metal-oxide-semiconductor-field-effect-transistors with ultra-narrow channels
TL;DR: In this article, the switching kinetics characteristics of interface traps in n-metal-oxide-semiconductor field effect transistors (n-MOSFETs) with ultra-narrow channels were investigated.
Journal ArticleDOI
Avalanche mechanism analysis of 4H-SiC n-i-p and p-i-n avalanche photodiodes working in Geiger mode
TL;DR: In this paper, the authors compared the performance of 4H-SiC n-i-p and p-n APDs in terms of the single photon counting efficiency, and found that the single-photon counting efficiency of n-p APDs is considerably higher than that of p-i n APDs.