Journal ArticleDOI
A differential interferometer for force microscopy
TLDR
In this paper, a polarizing optical interferometer was developed for force microscopy, where the deflection of the force-sensing cantilever is measured by means of the phase shift of two orthogonally polarized light beams.Abstract:
We present a polarizing optical interferometer especially developed for force microscopy. The deflections of the force‐sensing cantilever are measured by means of the phase shift of two orthogonally polarized light beams, both reflected off the cantilever. This arrangement minimizes perturbations arising from fluctuations of the optical path length. Since the measured quantity is normalized versus the reflected intensity, the system is less sensitive to intensity fluctuations of the light source. The device is especially well suited to static force measurements. The total rms noise measured is ≲0.01 A in a frequency range from 1 Hz to 20 kHz.read more
Citations
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Journal ArticleDOI
Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy.
TL;DR: The goal of this paper is to demonstrate that AFM is capable of producing atomic-scale knowledge, and to focus upon some of the contributions of the AFM to nanotribology.
Journal ArticleDOI
Atomic resolution with an atomic force microscope using piezoresistive detection
TL;DR: In this article, a new detection scheme for atomic force microscopy (AFM) was proposed to yield atomic resolution images of conducting and nonconducting layered materials using a piezoresistive strain sensor embedded in the AFM cantilever.
Journal ArticleDOI
Improved fiber‐optic interferometer for atomic force microscopy
TL;DR: In this article, a high-sensitivity fiber-optic displacement sensor for atomic force microscopy is described based on the optical interference occurring in the micron-sized cavity formed between the cleaved end of a singlemode optical fiber and the microscope cantilever.
PatentDOI
Apertureless near field optical microscopy
TL;DR: In this paper, a dither motion is applied to the tip at a first frequency in a direction substantially normal (22) to the plane of the sample surface (18), and then at a second frequency the motion is simultaneously applied to a sample (20) at a parallel direction (24) parallel to the surface plane (18) to reduce the detected background signal.
Journal ArticleDOI
Development of low noise cantilever deflection sensor for multienvironment frequency-modulation atomic force microscopy
TL;DR: In this paper, a low noise cantilever deflection sensor with a deflection noise density of 17fm∕Hz was developed by optimizing the parameters used in optical beam deflection (OBD) method.
References
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Journal ArticleDOI
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
Journal ArticleDOI
Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution
Y. Martin,H. K. Wickramasinghe +1 more
TL;DR: In this article, a force microscope is used to measure the magnetic force between a magnetized tip and the scanned surface, which shows promise for the high-resolution mapping of both static and dynamic magnetic fields.
Journal ArticleDOI
Single-tube three-dimensional scanner for scanning tunneling microscopy
G. Binnig,D. P. E. Smith +1 more
TL;DR: In this article, a three-dimensional mechanical scanner fabricated from a single piezoelectric tube is presented, with a typical response of 5 nm/V in each orthogonal direction and mechanical resonances at 8 kHz and 40 kHz, respectively.
Journal ArticleDOI
Force microscope using a fiber‐optic displacement sensor
TL;DR: In this paper, a force microscope using a fiber-optic interferometer as the cantilever displacement sensor is described, achieving a sensitivity of 1.7×10−4 A/(Hz)1/2 for frequencies above 2 kHz.
Journal ArticleDOI
Atomic force microscopy using optical interferometry
TL;DR: An atomic force microscope using optical interferometry as the lever detection method is presented in this paper, where topographic images of graphite with 50-A lateral resolution have been obtained using repulsive contact forces.