Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction , and Tip Estimation
TLDR
Treatment of the tip-surface interaction as a simple geometrical exclusion allows calculation of many quantities important for SPM dimensional metrology and Blind reconstruction, previously demonstrated only for simulated noiseless images, is here extended to images with noise or other experimental artifacts.Abstract:
To the extent that tips are not perfectly sharp, images produced by scanned probe microscopies (SPM) such as atomic force microscopy and scanning tunneling microscopy are only approximations of the specimen surface. Tip-induced distortions are significant whenever the specimen contains features with aspect ratios comparable to the tip’s. Treatment of the tip-surface interaction as a simple geometrical exclusionread more
Citations
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Gwyddion: an open-source software for SPM data analysis
David Nečas,Petr Klapetek +1 more
TL;DR: It is shown that on the basis of open-source software development, a fully functional software package can be created that covers the needs of a large part of the scanning probe microscopy user community.
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Force-distance curves by atomic force microscopy
Bruno Cappella,Giovanni Dietler +1 more
TL;DR: Atomic force microscopy (AFM) force-distance curves have become a fundamental tool in several fields of research, such as surface science, materials engineering, biochemistry and biology.
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Microstructural Characterization and Charge Transport in Thin Films of Conjugated Polymers
TL;DR: The characterization techniques that provide information used to enhance the understanding of structure/property relationships in semiconducting polymers are reviewed.
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Self-organization of nanostructures in semiconductor heteroepitaxy
TL;DR: In this article, the authors analyzed the driving forces of self-organization mechanisms in semiconductor heteroepitaxy and showed that under certain conditions, these mechanisms and their interplay result in self-organized nanostructure arrays with a high degree of uniformity.
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Review of Instrumented Indentation
TL;DR: An overview of instrumented indentation is given with regard to current instrument technology and analysis methods and research efforts at the National Institute of Standards and Technology aimed at improving the related measurement science are discussed.
References
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Book
Image Analysis and Mathematical Morphology
TL;DR: This invaluable reference helps readers assess and simplify problems and their essential requirements and complexities, giving them all the necessary data and methodology to master current theoretical developments and applications, as well as create new ones.
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Computer vision
TL;DR: How the field of computer (and robot) vision has evolved, particularly over the past 20 years, is described, and its central methodological paradigms are introduced.