Journal ArticleDOI
Dynamic atomic force microscopy methods
Ricardo Garcia,Rubén Pérez +1 more
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In this paper, the authors review the fundamentals, applications and future tendencies of dynamic atomic force microscopy (AFM) methods and present a detailed quantitative comparison between theoretical simulations and experiment.About:
This article is published in Surface Science Reports.The article was published on 2002-09-01. It has received 1908 citations till now. The article focuses on the topics: Non-contact atomic force microscopy & Oscillation.read more
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Force measurements with the atomic force microscope: Technique, interpretation and applications
TL;DR: The atomic force microscope (AFM) is not only used to image the topography of solid surfaces at high resolution but also to measure force-versus-distance curves as discussed by the authors, which provide valuable information on local material properties such as elasticity, hardness, Hamaker constant, adhesion and surface charge densities.
Journal ArticleDOI
Advances in atomic force microscopy
TL;DR: The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation AFM (FM-AFM), as well as other dynamic methods as discussed by the authors.
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Kelvin probe force microscopy and its application
TL;DR: Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials as discussed by the authors, including metallic nanostructures, semiconductor materials, and electrical devices.
Journal ArticleDOI
Nanostructured oxides in chemistry: characterization and properties.
Marcos Fernández-García,Arturo Martínez-Arias,Jonathan C. Hanson,José Antonio Lozano Rodríguez +3 more
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Surface nanobubbles and nanodroplets
Detlef Lohse,Xuehua Zhang +1 more
TL;DR: A review on surface nanobubbles and nanodroplets can be found in this article, where the authors discuss the nucleation, growth, and dissolution dynamics of surfaces.
References
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Journal ArticleDOI
Atomic force microscope
TL;DR: The atomic force microscope as mentioned in this paper is a combination of the principles of the scanning tunneling microscope and the stylus profilometer, which was proposed as a method to measure forces as small as 10-18 N. As one application for this concept, they introduce a new type of microscope capable of investigating surfaces of insulators on an atomic scale.
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Computer simulation of local order in condensed phases of silicon
TL;DR: A model potential-energy function comprising both two- and three-atom contributions is proposed to describe interactions in solid and liquid forms of Si, suggesting a temperature-independent inherent structure underlies the liquid phase, just as for ``simple'' liquids with only pair interactions.
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Effect of contact deformations on the adhesion of particles
TL;DR: In this article, it was shown that despite the van der Waals' forces being capable of increasing the elastic contact area between the ball and the plane, the force that is required to overcome the molecular forces arising when the contact is broken does not increase thereby.
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Kelvin probe force microscopy
TL;DR: In this paper, the authors measured the contact potential difference between different materials using scanning force microscopy (SfM) for the first time, using images of gold, platinum, and palladium surfaces taken in air.
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Frequency modulation detection using high‐Q cantilevers for enhanced force microscope sensitivity
TL;DR: In this article, a frequency modulation (FM) technique has been demonstrated which enhances the sensitivity of attractive mode force microscopy by an order of magnitude or more, which is made possible by operating in a moderate vacuum (<10−3 Torr).