Journal ArticleDOI
Apparent contrast reversal in tapping mode atomic force microscope images on films of polystyrene-b-polyisoprene-b-polystyrene
J.P. Pickering,Gyula J. Vancso +1 more
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In this paper, the relative contrast in height and phase mode images of the phase separated regions was found to be very sensitive to changes in the operating conditions of the microscope and was observed for the tri-block copolymer system examined in this study.Abstract:
Thin films of phase separated polystyrene-b-polyisoprene-b-polystyrene block copolymers were studied by tapping mode atomic force microscopy. The relative contrast in height and phase mode images of the phase separated regions was found to be very sensitive to changes in the operating conditions of the microscope. Contrast variations and reversals were observed for height and phase mode images as a function of the set-point amplitude ratio and drive frequency. No unique height or phase contrast was observed for the the tri-block copolymer system examined in this study.read more
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Journal ArticleDOI
A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences
TL;DR: The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of micro-structural parameters and unraveling the intermolecular forces at nanoscale level with atomic-resolution characterization as mentioned in this paper.
Journal ArticleDOI
Tapping mode atomic force microscopy on polymers: Where is the true sample surface?
TL;DR: In this article, the authors investigate the processes involved when soft polymeric materials are imaged with TappingMode atomic force microscopy (TM-AFM), measuring lateral arrays of amplitude/phase vs distance (APD) curves, they are able to determine quantitatively the amount of tip indentation and reconstruct the shape of the real surface of the sample.
Journal ArticleDOI
Quantitative mapping of elastic moduli at the nanoscale in phase separated polyurethanes by AFM
Peter Manfred Schön,Kristóf Bagdi,Kristóf Bagdi,Kinga Molnár,Kinga Molnár,Patrick Markus,Béla Pukánszky,Béla Pukánszky,G. Julius Vancso,G. Julius Vancso +9 more
TL;DR: In this article, the micro phase separated nanoscale morphology of phase separated polyurethanes (PUs) was visualized by atomic force microscopy (AFM) height and phase imaging of smooth surfaces obtained by ultramicrotonomy.
Journal ArticleDOI
Mixed polymer brushes by sequential polymer addition: anchoring layer effect.
TL;DR: This research studies HPB comprised of end-grafted polystyrene (PS) and poly(2-vinyl pyridine) (P2VP), which involves the use of an "intermolecular glue" acting as a binding/anchoring interlayer between the polymer brush and the substrate, a silicon wafer.
Reference EntryDOI
Scanning Force Microscopy
TL;DR: In this article, the application of scanning force microscopy to polymers is discussed based on a selection of topics covering the whole breadth from topography imaging to mapping of surface properties and studies of dynamic processes in real time.
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Chaotic and Fractal Dynamics: An Introduction for Applied Scientists and Engineers
TL;DR: In this paper, the authors present a method for identifying chaotic vibrations in physical systems, including fractals and dynamical systems, based on the concept of spatiotemporal chaos.