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Patent

Driver circuit, display device including the driver circuit, and electronic device including the display device

TLDR
In this paper, a thin film transistor whose channel is formed using an amorphous semiconductor is used for a driver circuit formed using only n-channel transistors or p-channel Transistors.
Abstract
One object is, when a thin film transistor whose channel is formed using an amorphous semiconductor is used for a driver circuit formed using only n-channel transistors or p-channel transistors, to provide a driver circuit in which the threshold voltage is compensated in accordance with the degree of change in the threshold voltage. In the driver circuit which includes a unipolar transistor including a first gate and a second gate which are disposed above and below a semiconductor layer with insulating layers provided therebetween, a first signal for controlling switching of the transistor is inputted to the first gate, a second signal for controlling a threshold voltage of the transistor is inputted to the second gate, and the second signal is controlled in accordance with a value of current consumption including a current which flows between a source and a drain of the transistor.

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Citations
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References
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Journal ArticleDOI

Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors

TL;DR: A novel semiconducting material is proposed—namely, a transparent amorphous oxide semiconductor from the In-Ga-Zn-O system (a-IGZO)—for the active channel in transparent thin-film transistors (TTFTs), which are fabricated on polyethylene terephthalate sheets and exhibit saturation mobilities and device characteristics are stable during repetitive bending of the TTFT sheet.
Journal ArticleDOI

Hydrogen as a cause of doping in zinc oxide

TL;DR: A first-principles investigation, based on density functional theory, produces strong evidence that hydrogen acts as a source of conductivity: it can incorporate in high concentrations and behaves as a shallow donor.
Journal ArticleDOI

Native point defects in ZnO

TL;DR: In this paper, the authors performed a comprehensive first-principles investigation of point defects in ZnO based on density functional theory within the local density approximation (LDA) as well as the $\mathrm{LDA}+U$ approach for overcoming the band-gap problem.
Journal ArticleDOI

Thin-Film Transistor Fabricated in Single-Crystalline Transparent Oxide Semiconductor

TL;DR: The fabrication of transparent field-effect transistors using a single-crystalline thin-film transparent oxide semiconductor, InGaO3(ZnO)5, as an electron channel and amorphous hafnium oxide as a gate insulator provides a step toward the realization of transparent electronics for next-generation optoelectronics.
Journal ArticleDOI

Oxygen vacancies in ZnO

TL;DR: Vlasenko and Watkins as mentioned in this paper showed that the oxygen vacancy VO is not a shallow donor, but has a deep e(2+∕0) level at ∼10eV below the conduction band.
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