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Journal ArticleDOI

Electromagnetic resonance enhanced photoabsorption in planar metal–oxide–metal tunnel junction detectors

J. B. D. Soole, +2 more
- 01 Mar 1987 - 
- Vol. 61, Iss: 5, pp 2022-2029
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TLDR
In this paper, surface plasmon and guided wave enhanced light absorption in the metal electrodes of planar aluminum-aluminum oxide-silver and aluminum aluminum oxide−aluminum tunnel junctions was investigated.
Abstract
We present calculations of surface plasmon and guided wave enhanced light absorption in the metal electrodes of planar aluminum–aluminum oxide–silver and aluminum–aluminum oxide–aluminum tunnel junctions. We consider excitation, under conditions of attenuated total reflection, of both the ‘‘fast’’ and ‘‘slow’’ surface plasmons of the junction, and of TE and TM guided modes supported by a dielectric film adjoining the junction. We find that >97% absorption may be obtained at resonance in a single electrode of a practical device, the thickness of which is only a fraction of the expected photocarrier mean free path, and show how the angular width of the absorption peak may be varied by changing the adjacent dielectric media. We also show how resonant absorption may be used in a biased planar device for the detection of radiation at normal incidence.

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Journal ArticleDOI

Metal cluster enhanced organic solar cells

TL;DR: In this paper, a Schottky junction formed at the interface of ITO and zinc phthalocyanine was investigated to study the influence of the metal particles on the optical extinction spectra and on the short circuit photocurrent spectra of such constructed organic solar cells.
Journal ArticleDOI

InGaAs metal-semiconductor-metal photodetectors for long wavelength optical communications

TL;DR: In this paper, a review of the properties of interdigitated metal-semiconductor-metal (MSM) Schottky barrier photodetectors based on the InGaAs-InP material system is discussed.
Journal ArticleDOI

Enhancement of photoelectric conversion efficiency by surface plasmon excitation : a test with an organic solar cell

TL;DR: In this paper, an organic solar cell consisting of Al, copper phthalocynine (CuPc) and Ag thin layers was prepared on a glass substrate and mounted on a prism to excite the surface plasmon polariton (SPP) in an attenuated total reflection geometry.
Journal ArticleDOI

Thermal stability of Ni/NiO multilayers

TL;DR: In this paper, the effects of NiO multilayer additions to pulsed-laser deposited nanocrystalline Ni on the grain growth and texture evolution during annealing have been studied using a combination of in situ AN in the transmission electron microscope and the recently developed transmission electron backscatter diffraction technique.
Journal ArticleDOI

Broadband Plasmonic Photocurrent Enhancement in Planar Organic Photovoltaics Embedded in a Metallic Nanocavity

TL;DR: In this paper, a substantial broadband increase in the external quantum effiency (EQE) of thin-fi lm organic photovoltaic (OPV) devices using near-fi eld coupling to surface plasmons is reported, signifi cantly enhancing absorption at surface plasmon resonance (SPR).
References
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Book

Principles of Optics

Max Born, +1 more
TL;DR: In this paper, the authors discuss various topics about optics, such as geometrical theories, image forming instruments, and optics of metals and crystals, including interference, interferometers, and diffraction.

Principles of Optics

Max Born, +1 more
TL;DR: In this article, the authors discuss various topics about optics, such as geometrical theories, image forming instruments, and optics of metals and crystals, including interference, interferometers, and diffraction.
Journal ArticleDOI

Optical Constants of the Noble Metals

TL;DR: In this paper, the optical constants for the noble metals (copper, silver, and gold) from reflection and transmission measurements on vacuum-evaporated thin films at room temperature, in the spectral range 0.5-6.5 eV.
Journal ArticleDOI

Die Bestimmung optischer Konstanten von Metallen durch Anregung von Oberflächenplasmaschwingungen

TL;DR: In this article, a method is given to determine accurately the optical constants and the thickness of thin films when the real and the imaginary part of the dielectric constants obey the condition ǫ ≥ 0.
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