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Journal ArticleDOI

Electropolishing Silicon in Hydrofluoric Acid Solutions

Dennis R. Turner
- 01 Jul 1958 - 
- Vol. 105, Iss: 7, pp 402-408
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This article is published in Journal of The Electrochemical Society.The article was published on 1958-07-01. It has received 597 citations till now. The article focuses on the topics: Electropolishing & Hydrofluoric acid.

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Journal ArticleDOI

Structural Investigation of Photoluminescent Porous Si by Transmission Electron Microscopy

S. Shih, +2 more
- 01 Jan 1992 - 
TL;DR: In this article, a diffraction pattern consisting of a diffuse center spot, characteristic of amorphous material, is observed for luminescent porous Si layers by transmission electron microscopy (TEM).
Journal ArticleDOI

Influence of bridge structure manipulation on the electrochemical performance of π-conjugated molecule-bridged silicon quantum dot nanocomposite anode materials for lithium-ion batteries

Young-Hwa Choi, +3 more
- 13 Jun 2023 - 
TL;DR: In this article , the influence of bridge structure manipulation on the electrochemical performance of π-conjugated molecule-bridged silicon quantum dot (Si QD) nanocomposite (SQNC) anode materials was assessed.
Book ChapterDOI

The Effect of Proton Bombardment on Porous Silicon Formation

T. Yashiro, +2 more
TL;DR: In this article, the influence of proton implantation for anodization of silicon in hydrofluoric acid has been investigated, and both p-and n-type silicon samples were used for the evaluation of the effect of the implantation effects.
Journal ArticleDOI

Influence of Etching Current Density on the Structural and Optical Properties of Porous Silicon Films Developed For Photovoltaic Applications

Salah Rahmouni, +4 more
- 13 Dec 2022 - 
Proceedings ArticleDOI

Injection system based on silicon oxide microneedles

Enrique Valera, +6 more
TL;DR: In this paper, a novel injection system based on silicon oxide microneedles is presented, which is hollow microcapillaries whose length ranges from tens to hundreds of microns and their tip diameter is in the range of micrometers.