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Proceedings ArticleDOI

Exact critical path tracing fault simulation on massively parallel processor AAP2

Y. Kitamura
- pp 474-477
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TLDR
A fault simulation method called the fault information tracing (FIT) algorithm is presented, a multiple fault propagation method which considers propagation of all possible stuck-at faults between a gate input and output and its suitability for parallel processors is discussed.
Abstract
A fault simulation method called the fault information tracing (FIT) algorithm is presented. Although the basic concept is similar to that of the critical path tracing (CPT) method, which traces sensitive inputs backward to directly determine the fault detectability, FIT is a multiple fault propagation method which considers propagation of all possible stuck-at faults between a gate input and output. Moreover, FIT manages a 'fault information flag' which represents both fault detectability and circuit topology between the current line and a primary output. Use of the fault information flag makes it possible to greatly reduce reconvergent fanout stem analysis. Consequently, exact and efficient simulation is achieved with near linear time complexity. The FIT algorithm is described and results are presented. In addition, the FIT procedure consists of simple propagation of fault information flags between logic gates, which enable implementation on parallel processors. Its suitability for parallel processors. Its suitability for parallel processing is discussed. Moreover, a parallel fault simulation method for AAP2, a massively parallel processor system containing 65536 processing elements, is described. >

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Citations
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Journal ArticleDOI

3-D Parallel Fault Simulation With GPGPU

TL;DR: An efficient parallel fault simulator, FSimGP2, that exploits the high degree of parallelism supported by a state-of-the-art graphic processing unit (GPU) with the NVIDIA compute unified device architecture to achieve extremely high computation efficiency on the GPU.
Journal ArticleDOI

Fault Table Computation on GPUs

TL;DR: This paper’s implementation is a significantly modified version of FSIM, which is pattern parallel fault simulation approach for single core processors, and employs a pattern parallel approach which utilizes both bit-parallelism and thread-level parallelism.
Patent

Performance evaluation method and device thereof for a parallel computer

TL;DR: In this article, a method and device are applied to a parallel computer which carries out parallel processing by transmitting and receiving messages among a plurality of processors, where various pieces of information are memorized such as an execution starting time, standby starting time for waiting for reception of the message, message number on reception, processor number of the processor, the message and time when the message is received, and message number of on transmitting the message.
Proceedings ArticleDOI

Fault table generation using Graphics Processing Units

TL;DR: The implementation of fault table generation on a Graphics Processing Unit (GPU) using a significantly modified version of FSIM, which is pattern parallel fault simulation approach for single core processors, to maximally harness the GPU's huge memory bandwidth and high computational power.

A Survey of Fault Simulation, Fault Grading and Test Pattern Generation Techniques with Emphasis on the Feasibility of VHDL Based Fault Simulation

TL;DR: The goal is to fully understand the current fault simulation state-of-the-art so that existing techniques can be used to assist in the design of a VHDL-based fault simulation tool.
References
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Journal ArticleDOI

A Deductive Method for Simulating Faults in Logic Circuits

TL;DR: A deductive method of fault simulation is described, which "deduces" the faults defected by a test at the same time that it simulates explicitly only the good behavior of logic circuit.
Journal ArticleDOI

Critical Path Tracing: An Alternative to Fault Simulation

TL;DR: Critical path tracing determines fault detection without explicit fault simulation, and appears to be a more efficient alternative to conventional methods.
Journal ArticleDOI

Concurrent simulation of nearly identical digital networks

E. G. Ulrich, +1 more
- 01 Apr 1974 - 
TL;DR: Test patterns for testing digital circuits are usually checked on a test verification program to determine if all or most of the possible faults will be detected.
Proceedings ArticleDOI

The concurrent simulation of nearly identical digital networks

E. G. Ulrich, +1 more
TL;DR: FANSSIM II as mentioned in this paper is a digital logic simulator under development capable of simulating a 2500 gate network in concurrence with approximately 10,000 single-fault networks, which is expected to be above a million signals/dollar, exceeding the real simulation rate for the IBM 360-50 by a factor of 50:1.
Journal ArticleDOI

A Parallel Adaptable Routing Algorithm and its Implementation on a Two-Dimensional Array Processor

TL;DR: It is shown experimentally that routing by the proposed algorithm implemented on the AAP-1 is 230 times faster than a software maze router run on a 1-MIPS computer for a three-pin/net circuit on a 256 X 256 grid.
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