Journal ArticleDOI
High spatial resolution secondary ion imaging and secondary ion mass spectrometry of aluminium‐lithium alloys
TLDR
The high signal-to-noise ratio of the positive secondary lithium ion opens up the possibility of both high resolution imaging and microanalysis of lithium distributions in aluminium and other materials as discussed by the authors.Abstract:
SUMMARY
Samples of aluminium-lithium alloys have been observed by scanning ion microscopy and analysed by secondary ion mass spectrometry. The high signal-to-noise ratio of the positive secondary lithium ion opens up the possibility of both high resolution imaging and microanalysis of lithium distributions in aluminium and other materials. Some of the problems encountered due to sample preparation are discussed and ion images of both the artefacts and the true lithium distribution are shown.read more
Citations
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Journal ArticleDOI
Practical resolution limits of imaging microanalysis with a scanning ion microprobe
TL;DR: Instrumental, physical and sample-dependent factors which impose limitations upon secondary ion mass spectrometry imaging microanalysis are discussed in this article, where those factors most relevant to scanning ion microprobe performance are emphasized.
Journal ArticleDOI
Critical issues in the application of a gallium probe to high resolution secondary ion imaging
Riccardo Levi-Setti,P. Hallegot,C. Girod,Jan M. Chabala,Jianwei Li,A. Sodonis,Wendy S. Wolbach +6 more
TL;DR: The use of liquid metal ion sources to form finely focused probes has enabled analytical imaging by secondary ion mass spectrometry to achieve, in favorable cases, spatial resolution approaching the theoretical localization limits of the method.
Journal ArticleDOI
Microanalysis of precipitates in aluminum-lithium alloys with a scanning ion microprobe
TL;DR: In this paper, the authors used a high-lateral-resolution scanning ion microprobe to determine the Li distribution in Al-Li alloys containing less than about Li and obtained 7Li+, 27Al+ and 34(AlLi)+ distribution images exhibiting better than 100 nm spatial resolution that show both the distribution of Li in binary alloys and the morphology of δ (AlLi phase) plates.
Journal ArticleDOI
Scanning ion microprobe analysis of composite materials
TL;DR: In this paper, the authors describe applications of scanning ion imaging with high lateral resolution in the microchemical investigation of metal and ceramic-matrix composites, which combines a scanning ion microprobe with secondary ion mass spectrometry (SIMS) for the study of complex, multicomponent composite structures.
Journal ArticleDOI
Secondary ion imaging of the distribution of δ′ (Al3Li) in Al-Li alloys
TL;DR: In this paper, a high resolution scanning ion microprobe was used, in conjunction with transmission electron microscopy, to study the distribution of the metastable δ' (Al3Li) phase in Al-Li alloys.
References
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Journal ArticleDOI
Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline Targets
TL;DR: In this article, an integrodifferential equation for the sputtering yield is developed from the general Boltzmann transport equation, and solutions of the integral equation are given that are asymptotically exact in the limit of high ion energy as compared to atomic binding energies.
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A high‐intensity scanning ion probe with submicrometer spot size
TL;DR: In this article, a liquid metal gallium ion source was imaged by a unity-magnification single-gap accelerating lens with a postlens deflector to form a focused scanning probe.
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Quantitative secondary ion mass spectrometry: A review
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Journal ArticleDOI
The use of secondary ion mass spectrometry in surface analysis
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