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Influence of photoexcitation on hopping conduction in neutron- transmutation-doped GaAs

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TLDR
In this article, the authors studied the tunneling assisted hopping conduction in GaAs under photoexcitation with a photon energy of 1.32 eV and found that the dopants activated by annealing around 400 °C provided the electrons to the defect levels originating the hop conduction even when under photo-excitation.
Abstract
The nature of the tunneling‐assisted hopping conduction in neutron‐transmutation‐doped GaAs has been studied under photoexcitation with a photon energy of 1.32 eV. It is found that the dopants activated by annealing around 400 °C provide the electrons to the defect levels originating the hopping conduction even when under photoexcitation. The hopping conduction under photoexcitation is affected by quenching in photoconductance below 120 K concerned with the main electron trap (EL2) and/or the As antisite defect (AsGa) induced by the neutron irradiation. The photoconductance of the samples with a lower radiation damage, AsGa≤1×1018 cm−3, consists of the coexistence of the hopping and band conductions.

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Citations
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Journal ArticleDOI

Neutron transmutation doping effects in GaN

TL;DR: In this article, the effects of neutron transmutation doping were studied for undoped (residual donor concentrations <1015 cm−3) GaN films grown by metalorganic chemical vapor deposition.
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Photoluminescence study of the annealing behavior of transmuted impurities in neutron‐transmutation‐doped semi‐insulating GaAs

TL;DR: In this article, the photoluminescence technique has been used to evaluate the annealing behavior of band-germanium acceptor [Ge(B]-A] transitions.
Journal ArticleDOI

The role of Ga antisite defect in the activation process of transmuted impurities in neutron‐transmutation‐doped semi‐insulating GaAs

TL;DR: In this paper, photoluminescence emissions around 860 and 935 nm at 77 K were associated with the two difference levels of Ga antisite defect (GaAs), and it was suggested that the annealing of GaAs defects plays an important role in the activation process of transmuted impurities as well as the as antisite defects forming midgap electron traps.
Journal ArticleDOI

Thermally stimulated current studies on neutron irradiation induced defects in GaN

TL;DR: In this article, the evaluation of the neutron irradiation induced defects in GaN was studied using a thermally stimulated current (TSC) method with excitation above (below) the energy band gap using ultraviolet (blue, green, red and infrared) emitting diodes.
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Deep electron and hole traps in neutron transmutation doped n-GaN

TL;DR: In this article, the electrical properties of doped n-GaN were investigated and electron traps at 0.45 or 0.2 eV were found to be dominant not by shallow Ge donors produced by interaction of thermal neutrons with Ga, but by electron traps with different radiation defects.
References
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Journal ArticleDOI

Conduction in glasses containing transition metal ions

TL;DR: In this article, a discussion of conduction in glasses containing transition metal ions is presented, and the Miller-Abrahams term and polaron hopping term tend to zero, giving a decreasing slope of the ln p versus 1/T curve.
Journal ArticleDOI

Photoelectric memory effect in GaAs

TL;DR: In this article, the existence of two states of the oxygen (or EL2) center in gallium arsenide has been explained by optical cross section, annealing, and electrical deexcitation.
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Photoelectronic properties of high‐resistivity GaAs : Cr

TL;DR: The photoelectronic properties of high resistivity n-type GaAs:: Cr are quite similar to those of high-resistivity n−type O-GaAs described in the preceding paper as discussed by the authors.
Journal ArticleDOI

Electron spin resonance of AsGa antisite defects in fast neutron‐irradiated GaAs

TL;DR: In this article, strong electron spin resonance spectra of the As4+Ga antisite defect have been observed in fast neutron-irradiated GaAs and it is suggested that these phenomena are microscopically explained by thermal annihilation of antisite defects.
Journal ArticleDOI

Kinetics of formation of the midgap donor EL2 in neutron irradiated GaAs materials

TL;DR: In this paper, the annealing kinetics of the two levels are studied and it is found that EL6 vanishes by a pair-defect (short-range) type recombination while the U band anneals by a long range migration process.
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