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Journal ArticleDOI

InGaP/GaAs single- and double-heterojunction bipolar transistors grown by organometallic vapour phase epitaxy

TLDR
In this paper, double-heterojunction bipolar transistors (DHBTs) grown by organometallic vapour phase epitaxy (OPE) were used for the first successful fabrication of DHBTs for this material system.
Abstract
InGaP/GaAs single-heterojunction bipolar transistors (HBTs) and double-heterojunction bipolar transistors (DHBTs) grown by organometallic vapour phase epitaxy are reported. A current gain beta =40 was obtained for 90 mu m diameter HBT devices at a base-collector bias of 0 V. The base carbon-doping concentration for the devices was 2*1019 cm-3 and the sheet resistivity ( rho s) of the base layer was 600 Omega / Square Operator . For the DHBTs, a current gain beta =27 was obtained for a base-collector bias of 2 V. The carbon doping concentration in these devices was 8*1018 cm-3 with rho s=1400 Omega / Square Operator . This represents the first successful fabrication of DHBTs for this material system.

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Citations
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Journal ArticleDOI

Comparison of In/sub 0.5/Ga/sub 0.5/P/GaAs single- and double-heterojunction bipolar transistors with a carbon-doped base

TL;DR: In this paper, a comparison of MOCVD-grown, np-n In/sub 0.5/P/GaAs single and double-heterojunction bipolar transistors (SHBTs and DHBTs) with a carbon-doped base is presented.
Journal ArticleDOI

Improved performance of carbon-doped GaAs base heterojunction bipolar transistors through the use of InGaP

TL;DR: In this paper, the authors demonstrate for the first time that carbon-doped GaAs/AlGaAs heterojunction bipolar transistors (HBTs) can be overcome through the use of InGaP.
Journal ArticleDOI

Gas source molecular beam epitaxial growth and device applications in In0.5Ga0.5P and In0.5Al0.5P heterostructures

J.M. Kuo
- 25 Aug 1993 - 
TL;DR: In this paper, a review of the recent progress in the In 0.5 Ga0.5 P epilayers lattice-matched to GaAs grown by gas source molecular beam rpitaxy (GSMBE) is presented.
Journal ArticleDOI

Design and performance of tunnel collector HBTs for microwave power amplifiers

TL;DR: In this paper, an improved HBT structure using a 100/spl Aring/-thick layer of GaInP between the GaAs base and collector layers is presented to address issues currently problematic for these devices: high offset and knee voltages and saturation charge storage.
Journal ArticleDOI

Carbon-impurity incorporation during the growth of epitaxial group III–V materials

TL;DR: In this paper, a review of the incorporation and behaviour of carbon in group III-V materials is presented, and the potential sources for the introduction of carbon to the growth front are compared in the light of their utility for obtaining high well-confined acceptor profiles, such as are required in the latest generation electronic and photonic devices.
References
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Journal ArticleDOI

Heterostructure bipolar transistors and integrated circuits

TL;DR: In this paper, the authors propose an inverted transistor strucure with a smaller collectors on top and a larger emitter on the bottom, with speed advantages over the common "emitter-up" design.
Journal ArticleDOI

Heterostructure bipolar transistors: What should we build?

TL;DR: Two new conceptual developments extending earlier concepts about emitter/base junction grading and an extension of permeable base transistor technology to bipolar transistors in what is called a gridded‐base bipolar transistor are proposed.
Journal ArticleDOI

Heterojunction bipolar transistor using a (Ga,In)P emitter on a GaAs base, grown by molecular beam epitaxy

TL;DR: The first N-p-n heterojunction bipolar transistor (HBT) using a (Ga,In)P/GaAs heter-junction emitter on a GaAs base was reported in this article.
Journal ArticleDOI

High quality AlxGa1−xAs grown by organometallic vapor phase epitaxy using trimethylamine alane as the aluminum precursor

TL;DR: In this paper, high quality AlGaAs using trimethylamine alane (TMAAl) as the aluminum source were grown by low pressure (30 Torr) organometallic vapor phase epitaxy (OMVPE) using a novel precursor.
Journal ArticleDOI

First microwave characterisation of LP-MOCVD grown GaInP/GaAs self-aligned HBT

TL;DR: In this paper, the microwave characterisation of GaInP/GaAs HBTs is reported and the transistor design is basically multimesas and the devices are obtained using a combination of dry and wet etching.
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