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Journal ArticleDOI

Low voltage performance of Pb(Zr,Ti)O3 capacitors through donor doping

Bao Yang, +3 more
- 15 Dec 1997 - 
- Vol. 71, Iss: 24, pp 3578-3580
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TLDR
In this article, low voltage performance of epitaxial ferroelectric Pb(Zr,Ti)O3-based capacitors was reported, where La substitution up to 10% was performed to systematically lower the coercive and saturation voltages.
Abstract
We report low voltage (1.5–3 V) performance of ferroelectric Pb(Zr,Ti)O3 based capacitors. La substitution up to 10% was performed to systematically lower the coercive and saturation voltages of epitaxial ferroelectric capacitors grown on Si using a (Ti0.9Al0.1)N/Pt conducting barrier composite. Ferroelectric capacitors substituted with 10% La show significantly lower coercive voltage compared to capacitors with 0% and 3% La. This is attributed to a systematic decrease in the tetragonality (i.e., c/a ratio) of the ferroelectric phase. Furthermore, the samples doped with 10% La showed dramatically better retention and pulse width dependent polarization compared to the capacitors with 0% and 3% La. These capacitors show promise as storage elements in low power high density memory architectures.

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Citations
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Journal ArticleDOI

Multiferroic BiFeO3 films: Domain structure and polarization dynamics

TL;DR: In this paper, the ferroelectric properties of epitaxial (001) oriented BiFeO3 films grown by different techniques on several substrates are reviewed and a thorough investigation of the ferromagnetic properties of BiO3 is performed.
Journal ArticleDOI

Point defect chemistry of metal oxide heterostructures

TL;DR: In this paper, the defect chemistry of perovskite ferroelectric oxides such as barium titanate and lead zirconate titanate has been studied for a wide range of applications that include nonvolatile memories and dynamic random access memories.
Journal ArticleDOI

Microstructural characterization of donor-doped lead zirconate titanate films prepared by sol–gel processing

TL;DR: In this article, the influence of donor dopants on the morphology, texture and defects of PZT films was studied using X-ray diffraction, Xray photoelectron spectroscopy, atomic force microscopy, scanning electron microscopy and fatigue.
Journal ArticleDOI

Detangling extrinsic and intrinsic hysteresis for detecting dynamic switch of electric dipoles using graphene field-effect transistors on ferroelectric gates

TL;DR: In this paper, a model of the charge trapping and pinning mechanism is proposed to successfully explain the transition in source-drain current vs. back gate voltage (ID-VBG) characteristics from extrinsic polar molecule dominant hysteresis to anti-hysteresIS induced by an oxygen deficient surface layer that is intrinsic to the ferroelectric thin films.
Journal ArticleDOI

Influence of La2O3, SrO, and ZnO Addition on PZT

TL;DR: In this article, the effect of ZnO, SrO, and La 2 O 3 additions on properties of lead zirconate titanate (PZT) nanopowder were investigated.
References
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Journal ArticleDOI

Oxidation of metastable single‐phase polycrystalline Ti0.5Al0.5N films: Kinetics and mechanisms

TL;DR: In this article, the authors used dc magnetron sputter deposition in mixed Ar+N2 discharges with an applied negative substrate bias of either 0 or 150 V. The oxide overlayers consisted of two partially crystalline sublayers, the upper one Al-rich and the lower one Ti-rich.
Journal ArticleDOI

Phase formation and characterization of hard coatings in the TiAlN system prepared by the cathodic arc ion plating method

TL;DR: Hard Ti x N and (Ti 1− x Al x )N films were prepared using the cathodic arc ion plating method as discussed by the authors, and they exhibited a cubic structure.
Journal ArticleDOI

Epitaxial cuprate superconductor/ferroelectric heterostructures.

TL;DR: Thin-film heterostructures of Bi4Ti3O12Bi2Sr2CuO6+x, have been grown on single crystals of SrTiO 3, LaAlO3, and MgAl2O4 by pulsed laser deposition and show the composition to be close to the nominal stoichiometry.
BookDOI

Science and technology of electroceramic thin films

TL;DR: In this article, the authors present an approach for the analysis of Ferroelectric metal oxide Heterostructures using Pulsed Laser Deposition (PLD) in a multi-component Electroceramic (EC) system.
Journal ArticleDOI

Domain configurations due to multiple misfit relaxation mechanisms in epitaxial ferroelectric thin films. II. Experimental verification and implications

TL;DR: In this article, a range of experimental data on domain populations in heteroepitaxial ferroelectric films is placed in the context of the stability map, where differential thermal expansion, cooling rate, and applied electric fields may be effectively used to control domain structure.
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