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Journal ArticleDOI

Optical Interposer Technology using Buried Vertical-Cavity Surface-Emitting Laser Chip and Tapered Through-Silicon Via for High-Speed Chip-to-Chip Optical Interconnection

TLDR
In this article, a novel optical interposer with optical interconnections is proposed for integrating three-dimensional (3D) LSI chips on this interposers, which realize precise passive alignment between the optical waveguides and the VCSEL/PD chips using two-step alignment processes consisting of cavity-assisted positioning and subsequent surface-tension-powered self-assembly with a molten solder.
Abstract
A novel optical interposer with optical interconnections is proposed for integrating three-dimensional (3D) LSI chips on this interposer. Vertical-cavity surface-emitting laser diode (VCSEL) chips and photo diode (PD) chips are buried in the optical interposer with polymeric optical waveguides. The VCSEL is 0.25 mm in width, 0.35 mm in length, and 0.15 mm in height. We realize precise passive alignment between the optical waveguides and the VCSEL/PD chips using two-step alignment processes consisting of cavity-assisted positioning and the subsequent surface-tension-powered self-assembly with a molten solder. In addition, we demonstrate the basic operation of the buried VCSEL chips in the optical interposer through tapered through-silicon vias (TSVs). The tapered TSVs are successfully formed by copper electroplating and are 64 µm in top width, 34 µm in bottom width, and 168 µm in length.

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Citations
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Journal ArticleDOI

Three-Dimensional Hybrid Integration Technology of CMOS, MEMS, and Photonics Circuits for Optoelectronic Heterogeneous Integrated Systems

TL;DR: The basic functions of individual chips of LSI, MEMS, and photonics devices as they were integrated into the3-D optoelectronic multichip module to verify the applied 3-D hybrid integration technology.
Proceedings ArticleDOI

Development of via-last 3D integration technologies using a new temporary adhesive system

TL;DR: New via-last backside-via 3D integration technologies using a unique temporary adhesive system in which visible-light laser is employed for wafer debonding from glass carriers are developed.
Proceedings ArticleDOI

Tiny VCSEL chip self-assembly for advanced chip-to-wafer 3D and hetero integration

TL;DR: The VCSEL was accurately positioned, successfully emitted 850-nm light, and exhibited no degradation of the I-V characteristics, and recent progress on the hybrid integration of chip-scale photonic devices with 3D/TSV technologies for optical interconnections is presented.
References
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Journal ArticleDOI

Future system-on-silicon LSI chips

TL;DR: In this work, several vertically stacked chip layers in 3D LSI chips or 3D multichip modules (MCMs) are fabricated using a new three-dimensional integration technology to overcome future wiring connectivity crises.
Journal ArticleDOI

Three-Dimensional Integration Technology Based on Wafer Bonding With Vertical Buried Interconnections

TL;DR: In this article, a 3D shared-memory test chip with three-stacked layers was fabricated by bonding the wafers with vertical buried interconnections after thinning.
Journal ArticleDOI

New Three-Dimensional Wafer Bonding Technology Using the Adhesive Injection Method.

TL;DR: In this paper, a new 3D wafer bonding technology using the adhesive injection method has been proposed, in order to realize a real-time micro-vision system and a real shared memory.
Journal ArticleDOI

PCB-compatible optical interconnection using 45/spl deg/-ended connection rods and via-holed waveguides

TL;DR: In this paper, a new architecture for a chip-to-chip optical interconnection system is demonstrated that can be applied in a waveguide-embedded optical printed circuit board (PCB).
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