Journal ArticleDOI
Quadruple well CMOS MAPS with time-invariant processor exposed to ionizing radiation and neutrons
Lodovico Ratti,Gianluca Traversi,Stefano Zucca,S. Bettarini,Fabio Morsani,G. Rizzo,Luciano Bosisio,Irina Rashevskaya +7 more
- Vol. 61, Iss: 4, pp 1763-1771
TLDR
In this article, a quadruple well CMOS active pixel sensor with a front-end channel has been fabricated in the frame of an R&D project aiming at developing low material budget, radiation hard detectors for tracking applications.Abstract:
Monolithic active pixel sensors featuring a timeinvariant front-end channel have been fabricated in a quadruple well CMOS process in the frame of an R&D project aiming at developing low material budget, radiation hard detectors for tracking applications. MAPS prototypes have been exposed to integrated fluences up to 1014 1 MeV neutron equivalent/cm2 to test the device tolerance to bulk damage also for different values of the epitaxial layer resistivity. Moreover, samples of the same device have been irradiated with γ-rays from a 60Co source, reaching a final dose exceeding 10 Mrad, to study ionizing radiation effects. This work discusses the test results, obtained through different measurement techniques, and the mechanisms underlying performance degradation in irradiated quadruple well CMOS MAPS.read more
Citations
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Journal ArticleDOI
The effect of the displacement damage on the Charge Collection Efficiency in Silicon Drift Detectors for the LOFT satellite
E. Del Monte,E. Del Monte,Y. Evangelista,Y. Evangelista,Enrico Bozzo,Franck Cadoux,A. Rachevski,Gianluigi Zampa,N. Zampa,Marco Feroci,Marco Feroci,M. Pohl,A. Vacchi +12 more
TL;DR: In this article, the authors report the measurement of the variation of charge collection efficiency produced by displacement damage caused by protons and the comparison with the expected damage in orbit during the assessment phase.
Journal ArticleDOI
The effect of the displacement damage on the Charge Collection Efficiency in Silicon Drift Detectors for the LOFT satellite
E. Del Monte,E. Del Monte,Y. Evangelista,Y. Evangelista,Enrico Bozzo,Franck Cadoux,A. Rachevski,Gianluigi Zampa,N. Zampa,Marco Feroci,Marco Feroci,M. Pohl,A. Vacchi +12 more
TL;DR: In this article, the authors report the measurement of the variation of charge collection efficiency produced by displacement damage caused by protons and the comparison with the expected damage in orbit during the LOFT assessment phase.
References
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CMOS image sensors: electronic camera-on-a-chip
TL;DR: In this article, the requirements for CMOS image sensors and their historical development, CMOS devices and circuits for pixels, analog signal chain, and on-chip analog-to-digital conversion are reviewed and discussed.
Journal Article
CMOS image sensors: Electronic camera-on-a-chip
TL;DR: In this article, the requirements for CMOS image sensors and their historical development, CMOS devices and circuits for pixels, analog signal chain, and on-chip analog-to-digital conversion are reviewed and discussed.
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Radiation-induced edge effects in deep submicron CMOS transistors
Federico Faccio,G. Cervelli +1 more
TL;DR: In this article, the authors studied the TID response of transistors and isolation test structures in a 130 nm commercial CMOS technology and demonstrated that the thin gate oxide of the transistors is extremely tolerant to dose, charge trapping at the edge of the transistor still leads to leakage currents and, for the narrow channel transistors, to significant threshold voltage shift.
Journal ArticleDOI
Large-signal analysis of MOS varactors in CMOS -G/sub m/ LC VCOs
R.L. Bunch,Sanjay Raman +1 more
TL;DR: In this article, the large-signal swing of the VCO output oscillation modulates the varactor capacitance in time, resulting in a VCO tuning curve that deviates from the dc tuning curve of the particular varactor structure.
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Total Ionizing Dose Effects on a Radiation-Hardened CMOS Image Sensor Demonstrator for ITER Remote Handling
Vincent Goiffon,Serena Rizzolo,Franck Corbière,Sébastien Rolando,Said Bounasser,Marius Sergent,Aziouz Chabane,Olivier Marcelot,Magali Estribeau,Pierre Magnan,Philippe Paillet,Sylvain Girard,Marc Gaillardin,Claude Marcandella,Timothe Allanche,Marco Van Uffelen,Laura Mont Casellas,Robin Scott,Wouter De Cock +18 more