Journal ArticleDOI
Semiconductor Manufacturers' Efforts to Improve Trust in the Electronic Part Supply Chain
Kaushik Chatterjee,Diganta Das +1 more
TLDR
In this paper, the role of part manufacturers in building trust in the supply chain is identified and part manufacturers, as the brand owners and trademark holders, play a critical role in enhancing trust in electronic part supply chain.Abstract:
One of the major problem areas in the electronic part supply chain is the issue of counterfeit electronic parts and the risks associated with them. Guidelines are needed for detecting, avoiding, and preventing the use of counterfeits in order to mitigate the risks associated with such parts. As part of this effort, we have identified the role of part manufacturers in building trust in the supply chain. Part manufacturers, as the brand owners and trademark holders, play a critical role in enhancing trust in the electronic part supply chain.read more
Citations
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Proceedings ArticleDOI
Secure Split-Test for preventing IC piracy by untrusted foundry and assembly
TL;DR: The results and analysis demonstrate that SST can effectively prevent counterfeited ICs from untrusted foundries or assemblies as well as its resilience to attacks and circumvention.
Proceedings ArticleDOI
Parametric counterfeit IC detection via Support Vector Machines
TL;DR: It is demonstrated that a one-class SVM classifier can be trained using only a distribution of process variation-affected brand new devices, but without prior information regarding the impact of transistor aging on the IC behavior, to accurately distinguish between these two classes based on simple parametric measurements.
Journal ArticleDOI
Recycled IC Detection Based on Statistical Methods
TL;DR: Two statistical methods for identifying recycled integrated circuits through the use of one-class classifiers and degradation curve sensitivity analysis are introduced and experimental results confirm their effectiveness in distinguishing between new and aged ICs.
Proceedings ArticleDOI
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry
TL;DR: This tutorial provides a comprehensive review of existing techniques which seek to prevent and/or detect counterfeit integrated circuits and an advanced machine learning-based method employing parametric measurements is described in detail.
Proceedings ArticleDOI
Remote inter-chip power analysis side-channel attacks at board-level
TL;DR: This paper shows that an FPGA used as a common accelerator in various boards can be reprogrammed by software to introduce a sensor, suitable as a remote power analysis side-channel attack vector at the board-level, and proves the potential vulnerability in which any untrusted chip on the board can launch such attacks on the remaining system.
References
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Journal ArticleDOI
Bogus: electronic manufacturing and consumers confront a rising tide of counterfeit electronics
Michael Pecht,Sanjay Tiku +1 more
TL;DR: In this article, the authors discuss the growing concern over the counterfeiting of electronics components and systems and identify three key factors as the root cause of this problem: the shift of manufacturing to China where intellectual property laws are not strictly enforced and supply chains are convoluted; the growing sophistication of technology that enables cheaper and more convincing fakes.
Journal ArticleDOI
The Electronic Part Supply Chain and Risks of Counterfeit Parts in Defense Applications
J. Stradley,D. Karraker +1 more
TL;DR: In this article, the authors make recommendations to ensure that trusted supply chains are available for policy decisions of the DoD: 1) The DoD and DoD contractors must buy direct from manufacturers or authorized distributors only.
Journal ArticleDOI
Avoiding Counterfeit Electronic Components
TL;DR: The most effective approach to avoiding counterfeit electronic components is to purchase product directly from the original component manufacturer, or from a distributor, reseller or aftermarket supplier who is franchised or authorized by the original manufacturer.