Journal ArticleDOI
The Meaning of Size Obtained from Broadened X‐Ray Diffraction Peaks
TLDR
In this paper, the correlation and discrepancies between peak profile analysis and TEM results are discussed in terms of the microstructures in different types of specimens in different classes of specimens.Abstract:
X-ray diffraction peak profile analysis (DPPA) is a powerful tool for the characterisation of microstructures either in the bulk or in loose powder materials. The evaluation and modelling procedures have been developed together with the experimental techniques. The dislocation density and structure, as obtained from peak profile analysis, is in good correlation with TEM observations. As for the crystallite size, in some cases a good correlation, however, in other cases definite discrepancies with TEM results can be observed. In the present work those literature data are critically reviewed where crystallite size or grain size have been determined by DPPA and TEM simultaneously. The correlation and discrepancies between DPPA and TEM results are discussed in terms of the microstructures in different types of specimens.read more
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The emergence of perovskite solar cells
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Nanocrystalline materials and coatings
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Development of a novel severe plastic deformation method for tubular materials: Tube Channel Pressing (TCP)
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Laura Chekli,B Bayatsarmadi,Ryo Sekine,Binoy Sarkar,AM Shen,Kirk G. Scheckel,William Skinner,Ravi Naidu,Ravi Naidu,Ho Kyong Shon,Ho Kyong Shon,Enzo Lombi,Erica Donner,Erica Donner +13 more
TL;DR: A critical review of their usefulness and limitations for nZVI characterisation is provided and example characterisation data derived from commercial nZ VI materials is used to further illustrate method strengths and limitations.
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Study on the post-rolling direction of severely plastic deformed Aluminum-Manganese-Silicon alloy
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