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How do you test a Mosfet voltage regulator? 

Power MOSFET
Field-effect transistor
Junction temperature
Transistor
MOSFET

Answers from top 10 papers

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Papers (10)Insight
Proceedings Article•DOI
NMOS Voltage Breakdown Characteristics Compared with Accelerated Life Tests and Field use Data
O. Hallberg
07 Apr 1981
6 Citations
It is possible to use this quick test for lot acceptance and to design a proper voltage screening for the particular batch under test.
Journal Article•DOI
A New Approach to the Voltage-Endurance Test on Electrical Insulation
L. Simoni
01 Sep 1973-IEEE Transactions on Electrical Insulation
68 Citations
This result suggests a new procedure for the voltage endurance test.
Journal Article•DOI
New statistical evaluation method for the variation of metal-oxide- semiconductor field-effect transistors
S. Watabe, Shigetoshi Sugawa, Akinobu Teramoto, Tadahiro Ohmi 
24 Apr 2007-Japanese Journal of Applied Physics
29 Citations
We have developed the test circuit for understanding the statistical and local variation of MOSFET in very short time.
Proceedings Article•DOI
Prognostics of Power MOSFET due to unclamped inductive switching
Neeraj Khera, Sharad Tiwari 
01 Jul 2016
3 Citations
The test will help in selecting the switching power MOSFET for the power electronic converters.
Proceedings Article•DOI
Power cycling methods for SiC MOSFETs
Christian Herold, J. Sun, Peter Seidel, Lukas Tinschert, Josef Lutz 
01 May 2017
72 Citations
In addition power losses during power cycling test should be generated in forward MOSFET-mode at high positive gate-voltage.
Journal Article•DOI
Ring Oscillator Technique for MOSFET $CV$ Characterization
Manjul Bhushan, Mark B. Ketchen, Ming Cai, Chin Kim 
07 May 2008-IEEE Transactions on Semiconductor Manufacturing
7 Citations
This minimizes dependencies on layout, spatial and statistical variations, as well as other ambiguities that can exist when a variety of test structures is used to evaluate different MOSFET and circuit performance parameters.
Proceedings Article•DOI
Impacts of static and dynamic local bending of thinned Si chip on MOSFET performance in 3-D stacked LSI
Hisashi Kino, Jichoel Bea, M. Murugesan, Kang-Wook Lee, Takafumi Fukushima, Mitsumasa Koyanagi, Tetsu Tanaka 
28 May 2013
11 Citations
In this study, for the first time, we investigated impacts of the static and dynamic local bending on MOSFET characteristics using a novel test structure.
Proceedings Article•DOI
Development of electrical test setup for microfluidic field effect transistor
Maizatul Zolkapli, M. A. Mohammed, Azrif Manut, R. Yahya 
01 Dec 2012
3 Citations
Experimental results reveal the electrical responses from the test setup are consistent with the MOSFET behavior and an alternative method for the microfluidic FET characterization.
Journal Article•DOI
Observation of electron velocity overshoot in sub-100-nm-channel MOSFET's in Silicon
Stephen Y. Chou, Dimitri A. Antoniadis, Henry I. Smith 
01 Dec 1985-IEEE Electron Device Letters
101 Citations
These experimental results strongly suggest velocity overshoot in a 75-nm-channel MOSFET.
Journal Article•DOI
A High-Reliability Gate Driver Integrated in Flexible AMOLED Display by IZO TFTs
Wei-Jing Wu, Zhang Lirong, Xu Zhiping, Lei Zhou, Hao Tao, Jianhua Zou, Miao Xu, Lei Wang, Junbiao Peng 
04 Jan 2017-IEEE Transactions on Electron Devices
21 Citations
In addition, the proposed gate driver has a good stability, since no voltage fluctuation occurs under 720-h test.

Related Questions

Why do we need to test VLSI chips udner varying voltages?3 answersTesting VLSI chips under varying voltages is necessary to ensure their proper functioning and to identify any imperfections or defects introduced during the manufacturing process. The complex mechanical and chemical steps involved in chip fabrication can lead to inaccuracies and imperfections, which may cause chip failures and profit loss. By applying test patterns and analyzing the chip's responses under different voltage conditions, potential timing-related defects can be detected and addressed. Additionally, testing under varying voltages allows for the identification of the chip's sensitivities to voltage variations, which can help in creating feedback systems to compensate for these changes and improve the overall performance of the chip. Therefore, testing VLSI chips under varying voltages is crucial for ensuring their reliability and functionality.
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