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Dominique Drouin

Researcher at Université de Sherbrooke

Publications -  213
Citations -  4353

Dominique Drouin is an academic researcher from Université de Sherbrooke. The author has contributed to research in topics: Silicon & Cathodoluminescence. The author has an hindex of 22, co-authored 204 publications receiving 3798 citations. Previous affiliations of Dominique Drouin include Institut national des sciences Appliquées de Lyon & STMicroelectronics.

Papers
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Proceedings ArticleDOI

A porous Ge/Si interface layer for defect-free III-V multi-junction solar cells on silicon

TL;DR: In this paper, a porous Si interface layer is introduced to intercept dislocations and prevent them from reaching the active layers of the device, which can both act as dislocation traps and as a soft compliant substrate, which displays high flexibility.
Patent

Method using sub-micron silicide structures formed by direct-write electron beam lithography for fabricating masks for extreme ultra-violet and deep ultra-violet lithography

TL;DR: In this article, a focused electron beam is displaced on the superposed layers of metal and silicon to form a structure of etch-resistant metal/silicon compound, which is then formed by etching the three layers to leave on the substrate, the metal/sicon compound structure with the extreme ultra-violet absorbent layer beneath it.
Patent

Fabrication of structures of metal/semiconductor compound by X-ray/EUV projection lithography

TL;DR: In this article, a method for fabricating structures of etch-resistant metal-semiconductor compound on a substrate with sub-micrometer scale resolutions is described, where superposed layers of metal and semiconductor capable of reacting with each other to form etchresistant metal/semiconductors are deposited on the substrate.
Proceedings ArticleDOI

Room temperature double gate single electron transistor based standard cell library

TL;DR: A family of digital logic cells based on double gate metallic SET working at room temperature and an evaluation of the performances characteristics in terms of power consumption and delay is detailed.
Journal ArticleDOI

Observation of Highly Nonlinear Resistive Switching of Al2O3/TiO2-x Memristors at Cryogenic Temperature (1.5 K).

TL;DR: In this article, the behavior of Al2O3/TiO2-x cross-point memristors in a cryogenic environment was investigated and successful resistive switching of memristor devices was reported.