Before the emergence of ultra-wideband (UWB) radios, widely used wireless communications were based on sinusoidal carriers, and impulse technologies were employed only in specific applications (e.g. radar). In 2002, the Federal Communication Commission (FCC) allowed unlicensed operation between 3.1–10.6 GHz for UWB communication, using a wideband signal format with a low EIRP level (−41.3dBm/MHz). UWB communication systems then emerged as an alternative to narrowband systems and significant effort in this area has been invested at the regulatory, commercial, and research levels.

IEEE Transactions on Microwave Theory and Techniques and Antennas and Propagation Announce a Joint Special Issue on Ultra-Wideband (UWB) Technology

This paper presents a comparative overview of the most important approaches presented to address the behavioral modeling of microwave and wireless power amplifiers (PAs). Starting from a theoretical framework of recursive and nonrecursive nonlinear filters, it proposes a classification of the various PA behavioral models, discussing their abilities to represent the different effects observed in practical circuits. Using that formal procedure, one explains how it was possible to integrate a wide range of behavioral modeling activities and to show that some of them, which at first glance seemed to be quite different, are, indeed, identical in their modeling capabilities.

A comparative overview of microwave and wireless power-amplifier behavioral modeling approaches

A new representation of the Volterra series is proposed, which is derived from a previously introduced modified Volterra series, but adapted to the discrete time domain and reformulated in a novel way. Based on this representation, an efficient model-pruning approach, called dynamic deviation reduction, is introduced to simplify the structure of Volterra-series-based RF power amplifier behavioral models aimed at significantly reducing the complexity of the model, but without incurring loss of model fidelity. Both static nonlinearities and different orders of dynamic behavior can be separately identified and the proposed representation retains the important property of linearity with respect to series coefficients. This model can, therefore, be easily extracted directly from the measured time domain of input and output samples of an amplifier by employing simple linear system identification algorithms. A systematic mathematical derivation is presented, together with validation of the proposed method using both computer simulation and experiment

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Dynamic Deviation Reduction-Based Volterra Behavioral Modeling of RF Power Amplifiers

Preface. About the Authors. Acknowledgments. 1 Power Amplifier Fundamentals. 1.1 Introduction. 1.2 Definition of Power Amplifier Parameters. 1.3 Distortion Parameters. 1.4 Power Match Condition. 1.5 Class of Operation. 1.6 Overview of Semiconductors for PAs. 1.7 Devices for PA. 1.8 Appendix: Demonstration of Useful Relationships. 1.9 References. 2 Power Amplifier Design. 2.1 Introduction. 2.2 Design Flow. 2.3 Simplified Approaches. 2.4 The Tuned Load Amplifier. 2.5 Sample Design of a Tuned Load PA. 2.6 References. 3 Nonlinear Analysis for Power Amplifiers. 3.1 Introduction. 3.2 Linear vs. Nonlinear Circuits. 3.3 Time Domain Integration. 3.4 Example. 3.5 Solution by Series Expansion. 3.6 The Volterra Series. 3.7 The Fourier Series. 3.8 The Harmonic Balance. 3.9 Envelope Analysis. 3.10 Spectral Balance. 3.11 Large Signal Stability Issue. 3.12 References. 4 Load Pull. 4.1 Introduction. 4.2 Passive Source/Load Pull Measurement Systems. 4.3 Active Source/Load Pull Measurement Systems. 4.4 Measurement Test-sets. 4.5 Advanced Load Pull Measurements. 4.6 Source/Load Pull Characterization. 4.7 Determination of Optimum Load Condition. 4.8 Appendix: Construction of Simplified Load Pull Contours through Linear Simulations. 4.9 References. 5 High Efficiency PA Design Theory. 5.1 Introduction. 5.2 Power Balance in a PA. 5.3 Ideal Approaches. 5.4 High Frequency Harmonic Tuning Approaches. 5.5 High Frequency Third Harmonic Tuned (Class F). 5.6 High Frequency Second Harmonic Tuned. 5.7 High Frequency Second and Third Harmonic Tuned. 5.8 Design by Harmonic Tuning. 5.9 Final Remarks. 5.10 References. 6 Switched Amplifiers. 6.1 Introduction. 6.2 The Ideal Class E Amplifier. 6.3 Class E Behavioural Analysis. 6.4 Low Frequency Class E Amplifier Design. 6.5 Class E Amplifier Design with 50# Duty-cycle. 6.6 Examples of High Frequency Class E Amplifiers. 6.7 Class E vs. Harmonic Tuned. 6.8 Class E Final Remarks. 6.9 Appendix: Demonstration of Useful Relationships. 6.10 References. 7 High Frequency Class F Power Amplifiers. 7.1 Introduction. 7.2 Class F Description Based on Voltage Wave-shaping. 7.3 High Frequency Class F Amplifiers. 7.4 Bias Level Selection. 7.5 Class F Output Matching Network Design. 7.6 Class F Design Examples. 7.7 References. 8 High Frequency Harmonic Tuned Power Amplifiers. 8.1 Introduction. 8.2 Theory of Harmonic Tuned PA Design. 8.3 Input Device Nonlinear Phenomena: Theoretical Analysis. 8.4 Input Device Nonlinear Phenomena: Experimental Results. 8.5 Output Device Nonlinear Phenomena. 8.6 Design of a Second HT Power Amplifier. 8.7 Design of a Second and Third HT Power Amplifier. 8.8 Example of 2nd HT GaN PA. 8.9 Final Remarks. 8.10 References. 9 High Linearity in Efficient Power Amplifiers. 9.1 Introduction. 9.2 Systems Classification. 9.3 Linearity Issue. 9.4 Bias Point Influence on IMD. 9.5 Harmonic Loading Effects on IMD. 9.6 Appendix: Volterra Analysis Example. 9.7 References. 10 Power Combining. 10.1 Introduction. 10.2 Device Scaling Properties. 10.3 Power Budget. 10.4 Power Combiner Classification. 10.5 The T-junction Power Divider. 10.6 Wilkinson Combiner. 10.7 The Quadrature (90 ) Hybrid. 10.8 The 180 Hybrid (Ring Coupler or Rat-race). 10.9 Bus-bar Combiner. 10.10 Other Planar Combiners. 10.11 Corporate Combiners. 10.12 Resonating Planar Combiners. 10.13 Graceful Degradation. 10.14 Matching Properties of Combined PAs. 10.15 Unbalance Issue in Hybrid Combiners. 10.16 Appendix: Basic Properties of Three-port Networks. 10.17 References. 11 The Doherty Power Amplifier. 11.1 Introduction. 11.2 Doherty's Idea. 11.3 The Classical Doherty Configuration. 11.4 The 'AB-C' Doherty Amplifier Analysis. 11.5 Power Splitter Sizing. 11.6 Evaluation of the Gain in a Doherty Amplifier. 11.7 Design Example. 11.8 Advanced Solutions. 11.9 References. Index.

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High Efficiency RF and Microwave Solid State Power Amplifiers

A comparative study of state-of-the-art behavioral models for microwave power amplifiers (PAs) is presented in this paper. After establishing a proper definition for accuracy and complexity for PA behavioral models, a short description on various behavioral models is presented. The main focus of this paper is on the modeling accuracy as a function of computational complexity. Data is collected from measurements on two PAs-a general-purpose amplifier and a Doherty PA designed for WiMAX-for different output power levels. The models are characterized in terms of accuracy and complexity for both in-band and out-of-band error. The results show that, among the models studied, the generalized memory polynomial behavioral model has the best tradeoff for accuracy versus complexity for both PAs, and can obtain high performance at half of the computational cost of all other models analyzed.

https://publications.lib.chalmers.se/records/fulltext/local_121905.pdf

A Comparative Analysis of the Complexity/Accuracy Tradeoff in Power Amplifier Behavioral Models

Theoretical and practical issues concerning the nonlinear dynamic modelling of electron devices are discussed in this article. All the different dynamic phenomena, which are important for the description of the device behaviour, are comprehensively dealt with by means of a unified mathematical derivation. In particular, both the “fast” dynamics associated with charge-storage phenomena at high operating frequencies and the “slow” dynamics of low-frequency dispersion, due to device self-heating and “charge-trapping” effects in deep-bulk and surface regions, are simultaneously taken into account. The result is an empirical, technology-independent and nonquasi-static model of electron devices, suitable for a simple and reliable identification procedure and based on conventional measurements of static characteristics and bias- and frequency- dependent small-signal parameters. The model implementation in the framework of commercially available CAD tools is also outlined in this article. Experimental validation, based on a GaAs p-HEMT, is also presented. © 2005 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2006.

Nonlinear RF device modelling in the presence of low-frequency dispersive phenomena: Research Articles

The extrinsic input and output capacitances of the field effect transistor small-signal equivalent circuit are typically extracted from the low frequency admittance parameters under “cold” pinch-off condition. Despite that, these two capacitances play a significant role also at high frequencies. Intuitively, a first hint of explanation stems from the high frequency reduction of their admittance values connected in parallel to the input and the output of the rest of the equivalent circuit. In particular, the extrinsic capacitances can cause an increase of the real parts of the impedance parameters at high frequencies. This article is aimed at developing an extensive experimental and mathematical analysis based on a comparative study of this behavior for GaN high electron mobility transistor (HEMT) devices up to the millimeter-wave range. The results of this analysis can be applied for estimating the extrinsic capacitances. The main benefit of this modeling technique is that the extrinsic output capacitance can be separated from the intrinsic output capacitance, which can play a significant role especially in case of large devices. © 2012 Wiley Periodicals, Inc. Int J RF and Microwave CAE , 2012. © 2012 Wiley Periodicals, Inc.

In-deep insight into the extrinsic capacitance impact on GaN HEMT modeling at millimeter-wave band

This paper presents a new behavioral model for VCO circuits based on a modeling. approach originally adopted for the description of the nonlinear dynamic behavior of electron devices. The new VCO model allows a great accuracy in the description of dynamic nonlinear operations and enables many limitations of existing modelling approaches to be overcome. The computational efficiency and the great accuracy of the model makes it suitable for system-level simulations. Results about the model prediction under small- and large-signal conditions and about its efficiency in comparison with transistor-level simulations are provided in the paper.

VCO behavioral modeling based on the nonlinear integral approach

An empirical approach is proposed which accounts for low-frequency dispersive phenomena due to surface state densities, deep level traps and device heating, in the modeling of the drain current response of III-V FETs. The model, which is based on mild assumptions justified both by theoretical considerations and experimental results, has been applied to GaAs MESFETs of different manufacturers. Experimental and simulation results that confirm the validity of the model are provided in the paper. >

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Empirical modeling of low-frequency dispersive effects due to traps and thermal phenomena in III-V FETs

Stability analysis of structures composed of transistors “paralleled” by means of power dividers/combiners is a keypoint in the design of MMIC power amplifiers. However, techniques to cope with this problem are quite rare in the literature and standard, straightforward tools are usually not available in CAD programs. A new simplified approach, hich can be applied using conventional linear tools for microwave circuit analysis, is proposed in this paper.

Giorgio Vannini

Papers

Nonlinear RF device modelling in the presence of low-frequency dispersive phenomena: Research Articles

In-deep insight into the extrinsic capacitance impact on GaN HEMT modeling at millimeter-wave band

VCO behavioral modeling based on the nonlinear integral approach

Empirical modeling of low-frequency dispersive effects due to traps and thermal phenomena in III-V FETs

Stability analysis of multi-transistor microwave power amplifiers