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Ivan K. Schuller
Researcher at University of California, San Diego
Publications - 670
Citations - 24033
Ivan K. Schuller is an academic researcher from University of California, San Diego. The author has contributed to research in topics: Superconductivity & Magnetization. The author has an hindex of 72, co-authored 639 publications receiving 22292 citations. Previous affiliations of Ivan K. Schuller include University of California, Los Angeles & University of California, Berkeley.
Papers
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Journal ArticleDOI
Intertwined magnetic, structural, and electronic transitions in V 2 O 3
Benjamin A. Frandsen,Benjamin A. Frandsen,Yoav Kalcheim,Ilya Valmianski,Alexander McLeod,Zurab Guguchia,Zurab Guguchia,Sky C. Cheung,Alannah Hallas,Murray Wilson,Yipeng Cai,Graeme Luke,Graeme Luke,Zaher Salman,Andreas Suter,Thomas Prokscha,Taito Murakami,Hiroshi Kageyama,Dimitri Basov,Dimitri Basov,Ivan K. Schuller,Yasutomo J. Uemura +21 more
TL;DR: In this article, a coordinated study of the paramagnetic-toantiferromagnetic, rhombohedral-to-monoclinic, and metal-toinsulator transitions in thin-film specimens of the classic Mott insulator was performed using low energy muon spin relaxation, x-ray diffraction, and nanoscale-resolved near-field infrared spectroscopic techniques.
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Operando characterization of conductive filaments during resistive switching in Mott VO2.
Shaobo Cheng,Min-Han Lee,Xing Li,Xing Li,L. Fratino,Federico Tesler,Myung-Geun Han,Javier del Valle,Robert C. Dynes,Marcelo J. Rozenberg,Ivan K. Schuller,Yimei Zhu +11 more
TL;DR: In this paper, the authors used in situ transmission electron microscopy, electrical transport measurements, and numerical simulations on Au/VO2/Ge vertical devices to study the electroforming process.
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Quantitative characterization of epitaxial superlattices by x-ray diffraction and high resolution electron microscopy
TL;DR: In this paper, a combination of quantitative intensity measurements and structural modeling is used to characterize the epitaxial CoO/NiO superlattice structure using high resolution electron microscopy (HREM).
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New calculational method for epitaxial energy: Application to an axial commensurate interface.
Sun M. Paik,Ivan K. Schuller +1 more
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Effect of photodiode angular response on surface plasmon resonance measurements in the Kretschmann-Raether configuration
F. Galvez,Carlos Monton,Aida Serrano,Ilya Valmianski,J. de la Venta,Ivan K. Schuller,Miguel A. García,Miguel A. García +7 more
TL;DR: The effect of photodiode angular response on the measurement of surface plasmon resonance (SPR) in metallic thin films using the Kretschmann-Raether configuration is studied and a calibration method is developed which corrects for this type of spectral shape distortions.