J
Jianqing Wang
Researcher at Nagoya Institute of Technology
Publications - 263
Citations - 3405
Jianqing Wang is an academic researcher from Nagoya Institute of Technology. The author has contributed to research in topics: Bit error rate & Ultra-wideband. The author has an hindex of 29, co-authored 238 publications receiving 3096 citations. Previous affiliations of Jianqing Wang include Tohoku University & Korea Maritime and Ocean University.
Papers
More filters
Proceedings ArticleDOI
FDTD calculation of organ resonance characteristics in an anatomically based human model for plane-wave exposure
TL;DR: In this paper, the authors analyzed numerically the organ resonance characteristics in the frequency range from 30 MHz up to 3 GHz with an anatomically based high-precision human body model and a parallel finite-difference time-domain (FDTD) technique.
Journal ArticleDOI
Amplitude Probability Distribution Measurement for Electric Field Intensity Assessment of Cellular-Phone-Base Stations
TL;DR: In this paper, a new approach has been proposed to estimate the 6-min time average from the ensemble average of the squared electric fields based on amplitude probability distribution (APD) measurements for a shorter time, much less than 6 min.
Proceedings ArticleDOI
Performance analysis on equal gain combining diversity receiver for implant body area networks
TL;DR: An EGC diversity system for implant BANs is presented which can improve the communication performance and the bit error rate (BER) performance by theoretical analysis and two approximation methods are introduced.
Journal ArticleDOI
An ESD Immunity Test for Battery-Operated Control Circuit Board in Myoelectric Artificial Hand System
Journal ArticleDOI
Iterative determination of complex permittivity and SAR distribution of two-dimensional biological body
Jianqing Wang,T. Takagi +1 more
TL;DR: In this article, an iterative inversion procedure is presented for noninvasive measurements of the complex permittivity and SAR distributions of two-dimensional biological bodies, which is tested numerically by using a two-layered circular model having high dielectric contrast.