J
Jun Suda
Researcher at Nagoya University
Publications - 384
Citations - 6165
Jun Suda is an academic researcher from Nagoya University. The author has contributed to research in topics: Epitaxy & Molecular beam epitaxy. The author has an hindex of 36, co-authored 362 publications receiving 5095 citations. Previous affiliations of Jun Suda include Panasonic & Chukyo University.
Papers
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Temperature Dependence of the Ag+Bg-Mode of Raman Shift for CaWO 4 Crystal
TL;DR: In this paper, the first-order Raman frequency shifts of the A g (2) + B g(2) mode in a CaWO 4 crystal were measured in the temperature range of 77∼771 K.
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Isochronal annealing study of Mg-implanted p-type GaN activated by ultra-high-pressure annealing
Kazufumi Hirukawa,Kensuke Sumida,Hideki Sakurai,Hajime Fujikura,Masahiro Horita,Yohei Otoki,Kacper Sierakowski,Michal Bockowski,Tetsu Kachi,Jun Suda +9 more
TL;DR: Isochronal annealing was performed on Mg-ion-implanted GaN under 1 GPa N2 ambient pressure for 5 min at temperatures of 1573-1753 K as discussed by the authors.
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Enhanced Channel Mobility in 4H-SiC MISFETs by Utilizing Deposited SiN/SiO2 Stack Gate Structures
TL;DR: In this paper, a fabricated SiN/SiO2 stack gate stack gate MIS capacitors have been investigated to improve the 4H-SiC MOS interface quality, showing that the use of thin SiN and increase in N2O-annealing time lead to a low interface state density of 1×1011 cm-2eV-1 at EC − 0.2 eV.
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Oxidation-induced majority and minority carrier traps in n- and p-type 4H-SiC
TL;DR: In this paper, the majority and minority carrier traps in lightly doped n- and p-type 4H-SiC epitaxial layers before and after thermal oxidation were investigated using deep level transient spectroscopy.
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Identification of type of threading dislocation causing reverse leakage in GaN p–n junctions after continuous forward current stress
Tetsuo Narita,Masakazu Kanechika,Jun Kojima,Hiroomi Watanabe,T. Kondo,Tsutomu Uesugi,Satoshi Yamaguchi,Yasuji Kimoto,Kazuyoshi Tomita,Yoshitaka Nagasato,Satoshi Ikeda,Masayoshi Kosaki,Tohru Oka,Jun Suda +13 more
TL;DR: In this paper , the authors identified the type of threading dislocations that provide pathways for this reverse leakage current and identified the Burgers vectors of these dislocation using large-angle convergent-beam electron diffraction.