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Ludvik Martinu

Researcher at École Polytechnique de Montréal

Publications -  314
Citations -  9653

Ludvik Martinu is an academic researcher from École Polytechnique de Montréal. The author has contributed to research in topics: Thin film & Microstructure. The author has an hindex of 48, co-authored 313 publications receiving 8645 citations. Previous affiliations of Ludvik Martinu include Heinrich Hertz Institute & École Polytechnique.

Papers
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Journal ArticleDOI

Real-time in situ growth study of TiN- and TiCxNy-based superhard nanocomposite coatings using spectroscopic ellipsometry

TL;DR: In this article, the growth of superhard ternary nanocomposite (nc)-TiN∕amorphous (a)−Si3N4 and quaternary nc−TiCxNy∕a−SiCN films was investigated in situ and in real-time.
Patent

Carbonaceous Protective Multifunctional Coatings

TL;DR: In this paper, a diamond-like carbon (DLC) coatings on metal substrates and methods of making the same are described. But the present paper relates to a preferred embodiment of a metallic substrate such as stainless steel or Ti alloy having a silicon material (such as an organosilicone, silicon nitride, silicon carbide or silicon carbon nitride) intermediate layer and a DLC layer, optionally doped with Si, deposited thereon.
Book ChapterDOI

Optical Coatings on Plastics

TL;DR: Synthetic organic polymers (plastics) are increasingly used in optics for replacement of the traditionally used glass as discussed by the authors, which is stimulated by the beneficial properties of plastics, namely their high strength-to-weight ratio, ease of manufacture of desired shapes, suitability for mass production, mechanical flexibility when in the form of films, webs or fibers and relatively low cost.
Journal ArticleDOI

Optical depth profiling of strontium titanate and electro-optic lanthanum-modified lead zirconium titanate multilayer structures for active waveguide applications

TL;DR: In this paper, a combination of variable angle spectroscopic ellipsometry and spectrophotometry was used to determine the refractive index depth profile of polycrystalline strontium titanate (STO) and lanthanum-modified lead zirconium titanates (PLZT) thin films.