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Thomas Fromherz

Researcher at Johannes Kepler University of Linz

Publications -  164
Citations -  8910

Thomas Fromherz is an academic researcher from Johannes Kepler University of Linz. The author has contributed to research in topics: Quantum dot & Quantum well. The author has an hindex of 30, co-authored 160 publications receiving 8443 citations.

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Ge∕Si islands in a three-dimensional island crystal studied by x-ray diffraction

TL;DR: In this paper, high-resolution x-ray diffraction has been used for the characterization of size, chemical composition, and strain of Ge∕Si (001) islands in a three-dimensional island crystal grown using self-assembly on a prepatterned (1) Si substrate.
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In-Situ Annealing and Hydrogen Irradiation of Defect-Enhanced Germanium Quantum Dot Light Sources on Silicon

TL;DR: In this paper, the defect-enhanced quantum dot (DEQD) was shown to have a high photoluminescence (PL) performance under thermal treatment up to 600 °C for at least 2 h.
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Dislocation engineering in SiGe heteroepitaxial films on patterned Si (001) substrates

TL;DR: In this paper, the authors demonstrate how nanopatterning of Si substrates with {111} trenches provides anisotropic elastic relaxation in a SiGe film, generates preferential nucleation sites for dislocation loops, and allows for dislocations trapping, leaving wide areas free of threading dislocations.
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Assessing Carrier Recombination Processes in Type‐II SiGe/Si(001) Quantum Dots

TL;DR: In this paper, different carrier recombination paths significantly broaden the photoluminescence (PL) emission bandwidth observed in type-II self-assembled SiGe/Si(001) quantum dots (QDs).
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Resonant donors in semiconductors: Sc impurity in CdSe and Cd1-xMnxSe.

TL;DR: These findings prove that the Coulombic part of the potential of a resonant donor impurity can create hydrogenic states in the forbidden energy gap and provide support for the two-fluid model of electronicStates in the vicinity of the metal-insulator transition.