T
Toshio Kamiya
Researcher at Tokyo Institute of Technology
Publications - 394
Citations - 41346
Toshio Kamiya is an academic researcher from Tokyo Institute of Technology. The author has contributed to research in topics: Amorphous solid & Thin film. The author has an hindex of 76, co-authored 383 publications receiving 38115 citations.
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Excitonic blue luminescence from p-LaCuOSe∕n-InGaZn5O8 light-emitting diode at room temperature
TL;DR: In this article, a hetero p∕n junction diode was fabricated by laminating an amorphous n-type InGaZn5O8 layer to a p-type LaCuOSe film epitaxially grown on a MgO (001) substrate.
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Electrical Properties and Structure of p-Type Amorphous Oxide Semiconductor xZnO·Rh2O3
Toshio Kamiya,Satoru Narushima,Hiroshi Mizoguchi,Ken-ichi Shimizu,Kazushige Ueda,Kazushige Ueda,Hiromichi Ohta,Hiromichi Ohta,Masahiro Hirano,Hideo Hosono +9 more
TL;DR: In this article, optoelectronic and structural properties are reported in detail for xZnO·Rh2O3 thin films in relation to the chemical composition x. All the films exhibit positive Seebeck coefficients, confirming p-type conduction.
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Holographic writing of volume-type microgratings in silica glass by a single chirped laser pulse
TL;DR: In this article, the volume-type gratings were holographically encoded inside pure SiO2 glass plates by a single chirped (0.5-5 ps duration) laser pulse generated from a mode-locked Ti:sapphire laser (wavelength ∼800 nm, emission pulse duration ∼100 fs).
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Intralayer A-Site Compositional Engineering of Ruddlesden–Popper Perovskites for Thermostable and Efficient Solar Cells
Youyu Jiang,Xinyi He,Tiefeng Liu,Nan Zhao,Minchao Qin,Junxue Liu,Fangyuan Jiang,Fei Qin,Lulu Sun,Xinhui Lu,Shengye Jin,Zewen Xiao,Toshio Kamiya,Yinhua Zhou +13 more
TL;DR: In this paper, a joint theoretical analysis of layered Ruddlesden-Popper (RP) perovskites is presented, where the authors show that the thermal stability of the layered perovskiy is improved through joint theoretical and experimental analysis.
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Amorphous In–Ga–Zn–O Dual-Gate TFTs: Current–Voltage Characteristics and Electrical Stress Instabilities
Katsumi Abe,Kenji Takahashi,Ayumu Sato,Hideya Kumomi,Kenji Nomura,Toshio Kamiya,Jerzy Kanicki,Hideo Hosono +7 more
TL;DR: In this paper, the authors studied the electrical characteristics and electrical stress instabilities of amorphous In-Ga-Zn-O (-IGZO) dual-gate thin-film transistors (DG TFTs).