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Viktor Sverdlov

Researcher at Vienna University of Technology

Publications -  268
Citations -  2194

Viktor Sverdlov is an academic researcher from Vienna University of Technology. The author has contributed to research in topics: Magnetoresistive random-access memory & Silicon. The author has an hindex of 21, co-authored 249 publications receiving 2008 citations. Previous affiliations of Viktor Sverdlov include University of Vienna & University of Geneva.

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The Effect of General Strain on the Band Structure and Electron Mobility of Silicon

TL;DR: In this article, a model capturing the effect of general strain on the electron effective masses and band-edge energies of the lowest conduction band of silicon was developed, and analytical expressions for the effective mass change induced by shear strain and valley shifts/splittings were derived using a degenerate kldrp theory at the zone-boundary X point.
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The Universality of NBTI Relaxation and its Implications for Modeling and Characterization

TL;DR: In this article, the authors argue that understanding the nature of the relaxation phase could hold the key to unraveling the underlying NBTI mechanism, and demonstrate the valuable consequences resulting therefrom.
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CMOS-compatible spintronic devices: a review

TL;DR: In this paper, a comprehensive review of the state-of-the-art spintronic devices for memory applications (STT-MRAM, domain wall motion MRAM, and spinorbit torque MRAM), oscillators (spin torque oscillators and spin Hall nano-oscillators), logic (logic-in-memory, all-spin logic, and buffered magnetic logic gate grid), sensors, and random number generators), are demonstrated beginning with predictive simulations, proceeding to their experimental confirmation and realization, and finalized by the current status of application in modern integrated systems
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Nanoscale silicon MOSFETs: A theoretical study

TL;DR: In this article, the authors carried out extensive numerical modeling of double-gate, nanoscale silicon n-metal oxide semiconductor field effect transistors (MOSFETs) with ultrathin, intrinsic channels connecting bulk, highly doped electrodes.
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Emerging memory technologies: Trends, challenges, and modeling methods

TL;DR: This paper discusses different memory technologies based on alternative principles of information storage, highlights the most promising candidates for future universal memory, and makes an overview of the current state-of-the-art of these technologies.