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Y. B. Zhu
Researcher at University of California, Irvine
Publications - 39
Citations - 1038
Y. B. Zhu is an academic researcher from University of California, Irvine. The author has contributed to research in topics: Neutral particle & Tokamak. The author has an hindex of 17, co-authored 39 publications receiving 878 citations.
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Journal ArticleDOI
Measurements and modeling of Alfvén eigenmode induced fast ion transport and loss in DIII-D and ASDEX Upgrade
M. A. Van Zeeland,W. W. Heidbrink,R. K. Fisher,M. Garcia Munoz,G. J. Kramer,D. C. Pace,Roscoe White,S. Aekaeslompolo,Max E Austin,J. E. Boom,I. G. J. Classen,S. da Graca,Benedikt Geiger,M.V. Gorelenkova,N. N. Gorelenkov,A.W. Hyatt,Neville C. Luhmann,M. Maraschek,George McKee,R.A. Moyer,Christopher Muscatello,Raffi Nazikian,Hyeon K. Park,S. E. Sharapov,W. Suttrop,G. Tardini,Benjamin Tobias,Y. B. Zhu,Diii-D +28 more
TL;DR: In this article, neutral beam injection into reversed magnetic shear DIII-D and ASDEX upgrade plasmas produces a variety of Alfvenic activity including toroidicity-induced Alfven eigenmodes (RSAEs) and reversed shear Alfven (RSE) during discharge current ramp phase when incomplete current penetration results in a high central safety factor and increased drive due to multiple higher order resonances.
Journal ArticleDOI
Observation of Critical-Gradient Behavior in Alfvén-Eigenmode-Induced Fast-Ion Transport
Cami Collins,William Heidbrink,Max E Austin,G. J. Kramer,David Pace,C.C. Petty,Luke Stagner,M. A. Van Zeeland,Roscoe White,Y. B. Zhu,Diii-D Team +10 more
TL;DR: The observation of stiff fast-ion transport suggests that reduced models can be used to effectively predict alpha profiles, beam ion profiles, and losses to aid in the design of optimized scenarios for future burning plasma devices.
Journal ArticleDOI
Growth and decay of runaway electrons above the critical electric field under quiescent conditions
Carlos Paz-Soldan,N.W. Eidietis,Robert Granetz,E. M. Hollmann,R.A. Moyer,J.C. Wesley,J. Zhang,Max E Austin,Neal Crocker,Andreas Wingen,Y. B. Zhu +10 more
TL;DR: In this article, a trace-level quiescentre runaway electron (RE) population was investigated in the flat-top of DIII-D Ohmic discharges and the transition from growth to decay was found to occur 3-5 times above the theoretical critical electric field for avalanche growth.
Journal ArticleDOI
Scintillator-based diagnostic for fast ion loss measurements on DIII-D.
R. K. Fisher,D. C. Pace,M. Garcia-Munoz,W. W. Heidbrink,Christopher Muscatello,M. A. Van Zeeland,Y. B. Zhu +6 more
TL;DR: Initial DIII-D results showing prompt losses and energetic ion loss due to MHD instabilities are discussed.
Journal ArticleDOI
Central flattening of the fast-ion profile in reversed-shear DIII-D discharges
W. W. Heidbrink,M. A. Van Zeeland,Max E Austin,K. H. Burrell,Nikolai Gorelenkov,G. J. Kramer,Y. Luo,M. A. Makowski,George McKee,Christopher Muscatello,Raffi Nazikian,E. Ruskov,W. M. Solomon,Roscoe White,Y. B. Zhu +14 more
TL;DR: In this article, fast-ion Dα (FIDA) spectroscopy was applied to the DIII-D tokamak to study the toroidicity-induced and reversed-shear Alfven eigenmodes.