Journal ArticleDOI
1/f noise as a reliability estimation for solar cells
TLDR
In this article, the 1/f noise from a forward biased dark solar cell is a non-destructive reliability estimation and the experimentally observed 1 /f noise is compared with Kleinpenning's one-dimensional calculations for p-n diodes.Abstract:
The 1/f noise from a forward biased dark solar cell is a non-destructive reliability estimation. The experimentally observed 1/f noise is compared with Kleinpenning's one-dimensional calculations for p-n diodes. At medium and low currents the 1/f noise of n+-p solar cells is about 50 times as large as predicted. Such deviations can be caused by non-uniformities in the large junction area. Local areas with lower built-in potentials at the junction lead to hot spots and reduced reliability. At large currents, reliability problems due to possible poor contacts can be studied from the proportionality between the noise and the square of the current.read more
Citations
More filters
Journal ArticleDOI
Noise as a diagnostic tool for quality and reliability of electronic devices
TL;DR: In this article, experimental facts about noise are presented which help us to understand the correlation between noise in a device and its reliability, and the main advantages of noise measurements are that the tests are less destructive, faster and more sensitive than DC measurements after accelerated life tests.
Book ChapterDOI
Electrical Noise as a Measure of Quality and Reliability in Electronic Devices
TL;DR: This chapter is devoted to an account of the success that has been obtained in using noise as a nondestructive indicator of reliability.
Journal ArticleDOI
Noise as a diagnostic and prediction tool in reliability physics
TL;DR: A review of the possibility of using noise measurements in analysis and prediction of electron device reliability is given in this paper, where the noise as an informative parameter for device reliability and its advantages and disadvantages are discussed.
Journal ArticleDOI
Electrical noise as a reliability indicator in electronic devices and components
TL;DR: In this article, a review is given of the developments in the subject over the last few years and a detailed understanding of some noise sources, such as in some semiconductor devices.
Journal ArticleDOI
A Cryogenic Process for Antisolvent-Free High-Performance Perovskite Solar Cells.
Annie Ng,Zhiwei Ren,Hanlin Hu,Patrick W. K. Fong,Qian Shen,Sin Hang Cheung,Pingli Qin,Jin-Wook Lee,Aleksandra B. Djurišić,Shu Kong So,Gang Li,Yang Yang,Charles Surya +12 more
TL;DR: The proposed cryogenic process enables decoupling of the nucleation and the crystallization phases by inhibiting chemical reactions in as-cast precursor films rapidly cooled down by immersion in liquid nitrogen, eliminating the need for the use of environmentally harmful antisolvents.
References
More filters
Journal ArticleDOI
Experimental studies on 1/f noise
TL;DR: Experimental studies on 1/f noise are reviewed with emphasis on experiments that may be decisive in finding the correct theoretical model for this type of noise as discussed by the authors. But the applicability of either theory turns out to be very limited.
Journal ArticleDOI
Forward characteristics and efficiencies of silicon solar cells
TL;DR: In this article, it was shown that the forward currents in commercial solar cells show an exponential dependence on the forward voltage as exp (qV/AkT) with A ⋍ 3.
Journal ArticleDOI
On the calculation of 1/f noise of contacts
TL;DR: In this paper, four models of constriction dominated contacts are considered, each with one circular contact area, and the results of different methods of calculating the 1/f noise intensity of contacts are presented.
Journal ArticleDOI
Noise spectral density as a device reliability estimator
Joel B. DuBow,Carl Osterwald +1 more
TL;DR: In this paper, the measurement of noise spectral density is proposed as an estimator of solar cell device reliability, and the use of associated temperature and bias stresses is investigated as a non-destructive rapid test method.