Journal ArticleDOI
A convenient method for removing surface oxides from tungsten STM tips
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TLDR
In this paper, a convenient treatment that can be applied to tungsten scanning tunneling microscope tips prepared by electrochemical etching in aqueous base is described, which removes the majority of the tengsten oxide layer present after etching and produces a very stable tunnel junction and a high success rate in preparing tips for atomic resolution imaging.Abstract:
A convenient treatment that can be applied to tungsten scanning tunneling microscope tips prepared by electrochemical etching in aqueous base is described The treatment removes the majority of the tungsten oxide layer present after etching and produces a very stable tunnel junction and a high success rate in preparing tips for atomic‐resolution imagingread more
Citations
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Preparation and characterization of electrochemically etched W tips for STM
TL;DR: In this article, the authors investigated methods for cleaning dc-etched polycrystalline tungsten tips for scanning tunnelling microscopy (STM), including Ar-ion sputtering, heating, chemical treatments and Ne-ion self-sputtering.
Journal ArticleDOI
Very sharp platinum tips for scanning tunneling microscopy
TL;DR: To achieve both high stability for scanning tunneling microscopy (STM) measurements and well defined tunnel current localization even on very rough surfaces, this paper developed a new electrochemical procedure using CaCl2 etching and H2SO4 micro polishing technique to obtain a very reproducible tip geometry.
Journal ArticleDOI
Characterization of electrochemically etched tungsten tips for scanning tunneling microscopy
TL;DR: In this paper, the shape and composition of electrochemically etched tungsten tips for use in scanning tunneling microscopy (STM) were investigated in a transmission electron microscope (TEM) with a Gathan imaging filter (GIP).
Journal ArticleDOI
Dynamic electrochemical-etching technique for tungsten tips suitable for multi-tip scanning tunneling microscopes
TL;DR: In this article, a method to prepare tungsten tips for use in multi-tip scanning tunneling microscopes is presented, which is based on a combination of a drop-off method and dynamic electrochemical etching, in which the tip is continuously and slowly drawn up from the electrolyte during etching.
Journal ArticleDOI
Preparation of platinum/iridium scanning probe microscopy tips
TL;DR: In this article, an etching setup for use in the preparation of platinum/iridium tips for atomic force microscopy and scanning electrostatic forces microscopy as well as scanning tunneling microscopy is presented.
References
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Book
CRC Handbook of Chemistry and Physics
TL;DR: CRC handbook of chemistry and physics, CRC Handbook of Chemistry and Physics, CRC handbook as discussed by the authors, CRC Handbook for Chemistry and Physiology, CRC Handbook for Physics,
Journal ArticleDOI
Generalized Formula for the Electric Tunnel Effect between Similar Electrodes Separated by a Thin Insulating Film
TL;DR: In this article, a formula for the electric tunnel effect through a potential barrier of arbitrary shape existing in a thin insulating film was derived for a rectangular barrier with and without image forces, where the true image potential was considered and compared to the approximate parabolic solution derived by Holm and Kirschstein.
Journal ArticleDOI
Field Ion Microscopy
TL;DR: In this article, the basic physical effects used in field ion microscopy are not yet fully understood, and a modified mechanism of field ionization and image interpretation has been proposed, using a high-voltage field ion microscope operated at up to 45 kV.